Citations refer to the original publication, not to a Scieee localized version.
Lebedev, V. B., Cimalla, V., Pezoldt, J., Himmerlich, M., Krischok, S., Lozano Suárez, J. G., & González Robledo, D. (2006). Effect of dislocations on electrical and electron transport properties of InN thin films. I. Strain relief and formation of a dislocation network. American Institute of Physics. https://doi.org/10.1063/1.2363233
Lebedev, Vladim B., et al. Effect of dislocations on electrical and electron transport properties of InN thin films. I. Strain relief and formation of a dislocation network. American Institute of Physics, 2006. https://doi.org/10.1063/1.2363233.
Lebedev, Vladim B., Volker Cimalla, J. Pezoldt, Marcel Himmerlich, Stefan Krischok, Juan Gabriel Lozano Suárez, and David González Robledo. Effect of dislocations on electrical and electron transport properties of InN thin films. I. Strain relief and formation of a dislocation network. American Institute of Physics, 2006. https://doi.org/10.1063/1.2363233.
Lebedev, V. B. et al. (2006) Effect of dislocations on electrical and electron transport properties of InN thin films. I. Strain relief and formation of a dislocation network. American Institute of Physics. Available at: https://doi.org/10.1063/1.2363233.
V. B. Lebedev et al., “Effect of dislocations on electrical and electron transport properties of InN thin films. I. Strain relief and formation of a dislocation network,” American Institute of Physics, 2006, doi: 10.1063/1.2363233.
@misc{lebedev2006effect,
author = {Lebedev, Vladim B. and Cimalla, Volker and Pezoldt, J. and Himmerlich, Marcel and Krischok, Stefan and Lozano Suárez, Juan Gabriel and González Robledo, David},
title = {Effect of dislocations on electrical and electron transport properties of InN thin films. I. Strain relief and formation of a dislocation network},
year = {2006},
publisher = {American Institute of Physics},
doi = {10.1063/1.2363233},
url = {https://doi.org/10.1063/1.2363233}
}
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