Citations refer to the original publication, not to a Scieee localized version.
Liu, S., Wu, L., León Galván, J. I., & Chen, B. (2022). Guest editorial: Machine learning for secure cyber-physical industrial control systems. Wiley-IET The Institution of Engineering and Technology. https://doi.org/10.1049/cps2.12029
Liu, Shichao, et al. Guest editorial: Machine learning for secure cyber-physical industrial control systems. Wiley-IET The Institution of Engineering and Technology, 2022. https://doi.org/10.1049/cps2.12029.
Liu, Shichao, Ligang Wu, José Ignacio León Galván, and Bo Chen. Guest editorial: Machine learning for secure cyber-physical industrial control systems. Wiley-IET The Institution of Engineering and Technology, 2022. https://doi.org/10.1049/cps2.12029.
Liu, S. et al. (2022) Guest editorial: Machine learning for secure cyber-physical industrial control systems. Wiley-IET The Institution of Engineering and Technology. Available at: https://doi.org/10.1049/cps2.12029.
S. Liu, L. Wu, J. I. León Galván, and B. Chen, “Guest editorial: Machine learning for secure cyber-physical industrial control systems,” Wiley-IET The Institution of Engineering and Technology, 2022, doi: 10.1049/cps2.12029.
@misc{liu2022guest,
author = {Liu, Shichao and Wu, Ligang and León Galván, José Ignacio and Chen, Bo},
title = {Guest editorial: Machine learning for secure cyber-physical industrial control systems},
year = {2022},
publisher = {Wiley-IET The Institution of Engineering and Technology},
doi = {10.1049/cps2.12029},
url = {https://doi.org/10.1049/cps2.12029}
}
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