Citations refer to the original publication, not to a Scieee localized version.
Sánchez López, C., Fernández Fernández, F. V., Tlelo-Cuautle, E., & Tan, S. X. D. (2011). Pathological element-based active device models and their application to symbolic analysis. Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/TCSI.2010.2097696
Sánchez López, Carlos, et al. Pathological element-based active device models and their application to symbolic analysis. Institute of Electrical and Electronics Engineers, 2011. https://doi.org/10.1109/TCSI.2010.2097696.
Sánchez López, Carlos, Francisco Vidal Fernández Fernández, E. Tlelo-Cuautle, and Sheldon X.-D. Tan. Pathological element-based active device models and their application to symbolic analysis. Institute of Electrical and Electronics Engineers, 2011. https://doi.org/10.1109/TCSI.2010.2097696.
Sánchez López, C. et al. (2011) Pathological element-based active device models and their application to symbolic analysis. Institute of Electrical and Electronics Engineers. Available at: https://doi.org/10.1109/TCSI.2010.2097696.
C. Sánchez López, F. V. Fernández Fernández, E. Tlelo-Cuautle, and S. X. D. Tan, “Pathological element-based active device models and their application to symbolic analysis,” Institute of Electrical and Electronics Engineers, 2011, doi: 10.1109/TCSI.2010.2097696.
@misc{sanchezlopez2011pathological,
author = {Sánchez López, Carlos and Fernández Fernández, Francisco Vidal and Tlelo-Cuautle, E. and Tan, Sheldon X.-D.},
title = {Pathological element-based active device models and their application to symbolic analysis},
year = {2011},
publisher = {Institute of Electrical and Electronics Engineers},
doi = {10.1109/TCSI.2010.2097696},
url = {https://doi.org/10.1109/TCSI.2010.2097696}
}
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