Citations refer to the original publication, not to a Scieee localized version.
Roca Moreno, E., Frutos Rayego, F., Espejo Meana, S. C., Domínguez Castro, R., & Rodríguez Vázquez, Á. B. (1998). Electrooptical measurement system for the DC characterization of visible detectors for CMOS-compatible vision chips. IEEE. https://doi.org/10.1109/19.744198
Roca Moreno, Elisenda, et al. Electrooptical measurement system for the DC characterization of visible detectors for CMOS-compatible vision chips. IEEE, 1998. https://doi.org/10.1109/19.744198.
Roca Moreno, Elisenda, Fabián Frutos Rayego, Servando Carlos Espejo Meana, Rafael Domínguez Castro, and Ángel Benito Rodríguez Vázquez. Electrooptical measurement system for the DC characterization of visible detectors for CMOS-compatible vision chips. IEEE, 1998. https://doi.org/10.1109/19.744198.
Roca Moreno, E. et al. (1998) Electrooptical measurement system for the DC characterization of visible detectors for CMOS-compatible vision chips. IEEE. Available at: https://doi.org/10.1109/19.744198.
E. Roca Moreno, F. Frutos Rayego, S. C. Espejo Meana, R. Domínguez Castro, and Á. B. Rodríguez Vázquez, “Electrooptical measurement system for the DC characterization of visible detectors for CMOS-compatible vision chips,” IEEE, 1998, doi: 10.1109/19.744198.
@misc{rocamoreno1998electrooptical,
author = {Roca Moreno, Elisenda and Frutos Rayego, Fabián and Espejo Meana, Servando Carlos and Domínguez Castro, Rafael and Rodríguez Vázquez, Ángel Benito},
title = {Electrooptical measurement system for the DC characterization of visible detectors for CMOS-compatible vision chips},
year = {1998},
publisher = {IEEE},
doi = {10.1109/19.744198},
url = {https://doi.org/10.1109/19.744198}
}
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