Citations refer to the original publication, not to a Scieee localized version.
Unterdechler, M., Gutiérrez Fernández, A. M., Sonnleithner, L., Rabiser, R., & Zoitl, A. (2022). Identifying repeating patterns in IEC 61499 systems using Feature-Based embeddings. IEEE. https://doi.org/10.1109/ETFA52439.2022.9921527
Unterdechler, Markus, et al. Identifying repeating patterns in IEC 61499 systems using Feature-Based embeddings. IEEE, 2022. https://doi.org/10.1109/ETFA52439.2022.9921527.
Unterdechler, Markus, Antonio Manuel Gutiérrez Fernández, Lisa Sonnleithner, Rick Rabiser, and Alois Zoitl. Identifying repeating patterns in IEC 61499 systems using Feature-Based embeddings. IEEE, 2022. https://doi.org/10.1109/ETFA52439.2022.9921527.
Unterdechler, M. et al. (2022) Identifying repeating patterns in IEC 61499 systems using Feature-Based embeddings. IEEE. Available at: https://doi.org/10.1109/ETFA52439.2022.9921527.
M. Unterdechler, A. M. Gutiérrez Fernández, L. Sonnleithner, R. Rabiser, and A. Zoitl, “Identifying repeating patterns in IEC 61499 systems using Feature-Based embeddings,” IEEE, 2022, doi: 10.1109/ETFA52439.2022.9921527.
@misc{unterdechler2022identifying,
author = {Unterdechler, Markus and Gutiérrez Fernández, Antonio Manuel and Sonnleithner, Lisa and Rabiser, Rick and Zoitl, Alois},
title = {Identifying repeating patterns in IEC 61499 systems using Feature-Based embeddings},
year = {2022},
publisher = {IEEE},
doi = {10.1109/ETFA52439.2022.9921527},
url = {https://doi.org/10.1109/ETFA52439.2022.9921527}
}
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