Citations refer to the original publication, not to a Scieee localized version.
Martinella, C., Alia, R. G., Stark, R., Coronetti, A., Cazzaniga, C., Kastriotou, M., Kadi, Y., Gaillard, R., Grossner, U., & Javanainen, A. (2021). Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies. Institute of Electrical and Electronics Engineers (IEEE). https://jyx.jyu.fi/handle/123456789/74596
Martinella, Corinna, et al. Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies. Institute of Electrical and Electronics Engineers (IEEE), 2021. https://jyx.jyu.fi/handle/123456789/74596.
Martinella, Corinna, R. G. Alia, R. Stark, Andrea Coronetti, C. Cazzaniga, M. Kastriotou, Y. Kadi, R. Gaillard, U. Grossner, and Arto Javanainen. Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies. Institute of Electrical and Electronics Engineers (IEEE), 2021. https://jyx.jyu.fi/handle/123456789/74596.
Martinella, C. et al. (2021) Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies. Institute of Electrical and Electronics Engineers (IEEE). Available at: https://jyx.jyu.fi/handle/123456789/74596.
C. Martinella et al., “Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies,” Institute of Electrical and Electronics Engineers (IEEE), 2021. [Online]. Available: https://jyx.jyu.fi/handle/123456789/74596
@misc{martinella2021impact,
author = {Martinella, Corinna and Alia, R. G. and Stark, R. and Coronetti, Andrea and Cazzaniga, C. and Kastriotou, M. and Kadi, Y. and Gaillard, R. and Grossner, U. and Javanainen, Arto},
title = {Impact of Terrestrial Neutrons on the Reliability of SiC VD-MOSFET Technologies},
year = {2021},
publisher = {Institute of Electrical and Electronics Engineers (IEEE)},
url = {https://jyx.jyu.fi/handle/123456789/74596}
}
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