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Mismatch distance term compensation in centroid configurations with nonzero-area devices

Abstract

This paper presents an analytical approach to distance term compensation in mismatch models of integrated devices. Firstly, the conditions that minimize parameter mismatch are examined under the assumption of zero-area devices. The analytical developments are illustrated using centroid configurations. Then, deviations from the previous approach due to the nonzero device areas are studied and evaluated.

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Mismatch distance term compensation in centroid configurations with nonzero-area devices

Author: Sánchez Karhunen, Eduardo; Fernández Fernández, Francisco Vidal; Rodríguez Vázquez, Ángel Benito
Publisher: Institute of Electrical and Electronics Engineers
Year: 1997
DOI: 10.1109/ISCAS.1997.621448
Source: https://idus.us.es/bitstreams/b99402e8-f1e7-47db-bbce-987a0fdcddcf/download
1997’
IEEE
In ema ional Symposium
on
Ci cui s
and
Sys ems,
June
9-12,1997,
H-Kong
--
Misma ch Dis ance Te m Compensa ion in[ Cen oid Con igu a ions
wi h Nonze o-A ea De ices
E.S.
Ka hunen, F ancisco V. Fe niindez and
A,.
Rod iguez Viizquez
Dep . o Analog and Mixed-Signal In eg a ed Ci cui Design, TMSE-CNM
Edi .
CICA,
A da. Reina Me cedes s/n, E,-41012 Se illa, SPAIN
Tel.: +34
5
4239923. FAX: +34
5
4231832, E-mail: [email p o ec ed]
Abs ac
This pape p esen s an analy ical app oach
o
dis-
ance e m compensa ion in misma ch models o in e-
g a ed de ices. Fi s ly, he condi ions ha minimize
pa ame e misma ch a e examined unde he assump ion
o
ze o-a ea de ices. The analy ical de elopmen s a e
illus a ed using cen oid con igu a ions. Then, de ia-
ions om he p e ious app oach due o he nonze o
de ice a eas a e s udied and e alua ed.
1.
In oduc ion
The endency in in eg a ed ci cui design owa ds
he use
o
submic on echnologies has mo i a ed
imp o emen s in he modeling
o
he second o de e ec s
o he
MOS
ansis o and o he andom a ia ions in he
ab ica ion p ocesses, which a e c i ical in he design
o
high pe o mance analog ci cui s
[
11-[7].
Va iabili y phenomena o elec ical cha ac e is ics
in in eg a ed ci cui s can be classi ied in o wo g oups:
in e -die a iabili y and in a-die misma ch. The i s one
accoun s o di e ences die- o-die o wa e - o-wa e ,
while he second is due
o
he exis ence o pa ame e luc-
ua ions in he wa e . We will ocus on in a-die misma ch
as
i
is he main esponsible o he de ia ions in analog
ci cui beha io .
The misma ch e ec on ci cui pe o mance has
been examined by many au ho s, and di e en misma ch
models ha e been p oposed ecen ly [3]-[9J. Sec ion
2
will b ie ly desc ibe he mos widely known in a-die
misma ch model: he Pelg om’s model. In sec ion 3 we
will ocus on he second e m o his model, which
accoun s o he misma ch due o he dis ance be ween
dle ices. An analy ical echnique o compensa e his mis-
ma ch is in oduced and applied
o
se e al cen oid con-
igu a ions. Finally, sec ion 4 examines he e ec o
aking in o accoun de ice a eas on he dis ance e m and
he magni ude
o
his pe u ba ion is e alua ed.
2.
Misma ch modelling
In 1988, Pelg om p oposed
a
model which has
become a e e ence o misma ch e ec s on analog in e-
0-7803-3583-X/97
$10.00
01997
IEEE
1644
g a ed ci cui s
[3].
Fo
wo samples
o
a
de ice wi h
equal
W.
L
and
a
sepa a ion dis ance
Ol2,
his model
associa es
a
s ochas ic a iable wi h he di e ence
be ween he alues o he same pa ame e in each ansis-
o (i. e. h eshold ol age). This s ochas ic a iable can
be ep esen ed by i s s anda d de ia ion,
A
aiid
S
being echnology-dependen i ing cons an s.
The i s e m in
(1)
includes he in luence
o
an-
sis o sizes and shapes ( hese do no appea explici ly
as
ec angula shapes a e assumed).
I
can be assumed ha
each ansis o pa ame e has
a
nominal alue and
a
supe imposed whi e noise. Associa ing Laplace ans-
o ms o he ansis o con igu a ion, i can be conside ed
as
a
noise il e ing p ocess. Then, his e m in
(1)
appea s
as
a
esul o noise powe no elimina ed in he il e ing
p ocess by he con igu a ion. The e o e, he con igu a-
ion in oduces
a
se o a iables in (l), namely, sizes and
shapes.
The second e m in (1) ep esen s he in luence o
he dis ance be ween ansis o s
DI2,
and is
a
conse-
quence o he exis ence o g adien s in he wa e . The
alue o any ansis o elec ical pa ame e
P
is ep e-
sen ed by
a
unc ion o dis ance in he wa e ,
P=Kd,
whe e:
d
is he dis ance om he poin whe e
P
is e alu-
a ed
o
he poin known
as
pe u ba ion cen e . This pe -
u ba ion cen e is he poin in he wa e whe e he
pa ame e akes i s maximudminimum alue. The e-
o e, he adial dependence o
a
pa ame e can be mod-
eled
as
a
cone whose e ex is he pe u ba ion cen e
[4].
P
P
3.
Misma ch Reduc ion Techniques
‘The physical in e p e a ion
o
each e m in (1) sug-
ges s di e len echniques
o
educe hem. The a ea e m
can only be educed by inc easing de ice a eas
[8]-[9].
Fo
sinall
de ices, his is he dominan e m and he dis-
ance e m can be neglec ed. Howe e , o high-pe o -
mance design, in which a eas a e ela i ely la ge,
dis ance e m plays an impo an ole. In o de o educe
his in luence, pa i ioning echniques and cen oid con-
igu a ions a e commonly used, al hough his is only
based in heu is ic conside a ions. In he ollowing, educ-
ion echniques a e analyzed using an analy ical app oach
which allows o ind ou con igu a ions wi h in e es ing
s a is ical p ope ies.
3.1.
De ice pa i ioning
Le us assume ha he pe u ba ion cen e is he e -
e ence poin o e e y dis ance. The e o e, he new se o
a iables
di
is he dis ance om each ansis o o he
pe u ba ion cen e (de ice sepa a ion
Ol2
can be easily
ob ained
as
he di e ence ec o ), as illus a ed in Fig.
1.
Ku ba ion cen e
Figu e
1:
Dis ances
o
pe u bacion cen e.
Gi en wo de ices,
ou
echnique pa i ions one o
bo h
o
hem in o a se o subdi isions
(M
and
N
espec-
i ely) and ies o combine hem, gene a ing di e en
con igu a ions, o imp o e he s a is ical pa ame e s. This
is illus a ed o he con en ional cen oid con igu a ion
in Fig.
2(b)
whe e one o he de ices in Fig. 2(a) has been
pa i ioned in o ou pieces. The g adien e ec compen-
sa ion due o he ou subdi isions seems o make he
pa ame e alue mo e uni o m. In his way we could
ob ain a educ ion o he s anda d de ia ion compa ed
wi h he one in he o iginal con igu a ion.
nu
Figu e
2:
(a) Basic S uc u e; (b) Cen oid s uc u e.
3.2.
Ma hema ical
model
A ma hema ical model mus be de eloped o e alu-
a e he in luence on misma ch o he pa i ions pe o med
on he ansis o s. Pa ame e misma ch is an s ochas ic
a iable, hence he unique way o ob ain his model is
using i s i s - and second-o de s a is ics: mean and s an-
da d de ia ion.
We will i s assume ze o-a ea ansis o s placed in
hei geome ic cen es. This is easonable as we a e
y-
ing o educe he dis ance e m o Pelg om's model, and
hence in a i s app oxima ion we a e in e es ed only in
he dis ance be ween he pa i ions bu no in hei a eas.
Assuming a adial dependence o he pa ame e
P
,
P=
P
0
+K,d
(2)
and a e aging dis ances om each pa i ion o he pe u -
ba ion cen e, he pa ame e a ia ion is
N
M
(3)
j=l
j=]
whe e
K
is he g adien slope on he wa e ,
di
and
d.,
a e
he dis ances om each pa i ion o he pe u ba ion cen-
e, and,
M
and
N
a e he numbe o pa i ions in each
de ice.
Du ing he design o a ci cui he ela i e posi ion o he
con igu a ion wi h espec o he pe u ba ion cen e is
unknown,
so
we mus calcula e misma ch as an a e age
o
AP
o e e y possible con igu a ion posi ion wi h
espec o he pe u ba ion cen e. The mean is,
J
27[/
N
and he s anda d de ia ion is gi en by,
2
27c
N
M
0
i=l
j=1
IS^
=
&I
[A
di-G
1
dj]'I
da-E
[AP]
(5)
a
This ma hema ical model can be used o compa e
di e en con igu a ions. I equi es he e alua ion o (4)
and
(3,
wha can be done by exp essing dis ances o he
pe u ba ion cen e as a unc ion o he symme ical cen-
e o he con igu a ion.
3.3.
E alua ion o di e en cen oid s uc u es
Fig.
3
shows se e al cen oid con igu a ions and
he e alua ion o hei s a is ical p ope ies using equa-
ions
(4)
and
(5).
In each case, dis ances om ansis o s
o pe u ba ion cen e,
d,
and
d,
we e exp essed as a
unc ion o he dis ance
R
om he con igu a ion cen e
o he pe u ba ion cen e , as shown in Fig.
4.
Assuming
ze o-a ea de ices, dis ances can be exp essed as:
-,
I is impossible o sol e (4)-(6) analy ically. Bu , expand-
ing
di
and
dj
in Taylo se ies a ound
R
and unca ing
i app op ia ely, hese in eg als can be sol ed analy ically
wi h high accu acy (e o is
<0.1%).
T unca ion o Tay-
lo
se ies is a easonable app oxima ion, since
<(
R
.
1645
on
2
K
AP=-
4R
_.
I
do
I
'I
0
ilP
=
0
32
R'
'xp
I
'V
U.
0
FP
=
0
2
o=
32
R
0%
TP
=
0
2
K2/
(J
=-
2
32
R
2
AP=-
4R
-
K
Figu e
3:
Mean and de ia ion o di e en s uc u es.
ype u ba ion cen e
Figu e
4:
Illus a ing dis ances
o
he pe u ba ion cen e .
The esul s in Fig.
3
a e e y in e es ing o design-
e s. Fo ins ance, he de ailed analy ical s udy
o
he con-
en ional cen oid s uc u e shows ha al hough i
p esen s qui e low s anda d de ia ion, he mean is no
ze o; on he con a y, i is in e sely p opo ional o he
dis ance o pe u ba ion cen e. This is disad an ageous
compa ed o ins ance o ci cula s uc u es. The p ice o
pay in hese is
a
la ge layou a ea.
4.
A ea in luence
on
dis ance e m
In he model shown in sec ion
3,
he dis ances om
each ansis o o he pe u ba ion cen e ha e been mea-
su ed om he geome ic cen e
o
each pa i ion.
In
his
sec ion he in luence
o
conside ing non-ze o a ea pa i-
ions
is
s udied.
I
mus be no iced
ha
we a e ocusing
only
on
he dis ance e m o Pelg om's model. This will
make clea ha he e exis a co ela ion be ween he mis-
ma ch e m due o he dis ance be ween ansis o pa i-
ions and hei sizes.
In o de o unde s and his in luence, conside an
isola ed de ice, as illus a ed in Fig.
5.
I
he ansis o is
conside ed
a
poin loca ed in i s geome ical cen e,
much in o ma ion is being
los .
A
mo e accu a e calcula-
ion is
10
a e age ou he dis ance o he pe u ba ion cen-
e :
D
--
-!--.~JA/.X
22
+y
dA
1
--
WL (7)
A
Then, he ze o-a ea model equa ions can be
used
subs i-
u ing
d
by an a e age dis ance. The new mean is,
and a co esponding exp ession can be ob ained o he
s anda d de ia ion. The in e p e a ion o hese equa ions
has a clea geome ical meaning
as
shown in
Fig.
6.
Fi s ,
o
each angula posi ion
o
he con igu a ion o he pe -
u ba ion cen e
a,
an a e age dis ance o each pa i ion
mus be calcula ed. Then, his p e ious esul mus be
a e aged o each possible ini ial posi ion o a pa i ion
wi h espec o he Pe u ba ion cen e
p
.
L
-
I.
Figu e
5:
Illus a ing a ea in luence.
This echnique is
oo
complex
as
an a e age dis ance
o
each pa i ion mus be calcula ed o each angula posi-
ion
a.
In he ze o-a ea model, ajec o ies desc ibed by
1646
Figu e
6:
Geome ic
in e p e a ion
o
(8)
pa i ion cen e s a e pe ec ly ci cula (pa i ion cen e is
cons an and equal o he geome ical cen e). Howe e ,
in he nonze o-a ea model, hese ajec o ies a e no ci -
cula , because he a e age dis ance o each pa i ion
depends on he alue o
a.
The esolu ion complexi y
o
equa ions in ze o-a ea
model was high bu , assuming he pa i ion cen e s
dependen on
a,
he equa ion esolu ion
is
e en mo e
di icul .
To
a oid his p oblem, an equi alen p-inde-
penden poin can be conside ed. Wi h his app oach, he
a ea in eg als a e elimina ed and he model complexi y
is
signi ican ly educed. This poin is ob ained a e aging all
he a ea o each pa i ion o each
p
alue. This gi es:
2
0A
which can be used in he equa ions o he ze o-a ea mod-
els (4)-(5).
5.
Pe u ba ion magni ude
I
is
also impossible o sol e equa ion
(9)
in gene al,
bu he displacemen o he pa i ion equi alen cen e
wi h espec o i s geome ical cen e can be a alua ed o
some simple case, i.e.
p
=
-
,
shown in Fig.
5.
Assum-
2
ing
D>>
W,
expanding equa ion
(7)
in
a
Taylo se ies, and
in eg a ing o e he gi en a ea, an app oxima ed analy i-
cal esul can be ob ained.
A
mo emen o he pa i ion
cen e wi h espec
o
he geome ical cen e
is
obse ed,
which o he case
in
Fig.
5
is&.
In he gene al case, we should a e age his mo e-
men o each alue o
p.
The p oblem can be sol ed
nume ically, using enough
p
samples o ob ain an accu-
a e alue o he displacemen . The calcula ed alue is
a ound
0.0427
.
Taking in o accoun p e ious esul s, nonze o-a ea
de ices cause a loss o symme y in he con igu a ion.
Assuming ha we a e wo king wi h
a
wa e diame e
o
10
cen ime e s, ha he pe u ba ion cen e is on he
7
WL
wa e , and ha we ha e ypical alues
o
de ice sizes
(50ym),
he assump ion
D
>>
,
W,
L
can be conside ed
conse a i e, and hence he app oxima ions in he mod-
els a e alid.
E alua ing he pa i i ion cen e mo emen using
he p e ious nume ical esul , and he alues o he di -
e en a iables in ol ed, he ob ained a e age displace-
men
is
a ound 0.02y.m. Conside he dis ance alues
used
in
sec ion
3,
which a e
he
dis ances om he pa i-
ion geome ical cen e s
o
he con igu a ion cen e ,
which a e hal a ansis o size a leas (a ound
25pm).
The e o e, he dis ance e o using 25pm ins ead
o
al-
ues a ound 25.02
pm
is smalle han
0.01%.
So,
his
mo emen can be neglec ed.
Bu , i is he in luence on he pa ame e misma ch
he eally signi ican in o ma ion. The e alua ion o he
mean and s anda d de ia ion o each s uc u e using
nonze o and ze o-a ea models gi es
a
ela i e e o
be ween he esul s p o ided by each model a ound 0.5%
in qui e ex eme cases (assuming squa e de ices wi h
a
200ym
side and
lR=Q.
1).
6.
Conclusion.
A misma ch e alua ion echnique o pa i ioned
s uc u es has been de eloped. Fi s ly, ansis o pa am-
e e s ha e been s a is ically cha ac e ized assuming ze o-
a ea de ices. Then, he a ea in luence has been exam-
ined. These a eas cause a ansis o cen e mo emen , bu
i
is
e i ied ha hei in luence on ze o-a ea esul s can
be neglec ed, assuming ypical dis ance alues.
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J.
B.
Shyu, G. C. Temes, and K.
Yao,
'Random E o E ec s in
Ma ched MOS Capaci o s and Cu en Sou ces',
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o
Solid-S a e Ci cui s,
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pp.
948-955, Dec. 1984.
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A.
Hadaway, and M. A. Copeland,
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o
Misma ch in MOS T ansis o s
o P ecision Analog Design',
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pp.
1057-1066, Dec. 1986.
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A.
C.
J.
Duinmaije , and A.
P.
G.
Welbe s,
'Ma ching P ope ies o
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o
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D.
Meindl, 'Sho Channel MOST
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M.
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Kubo, 'Cha ac e is ics and
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M. Gowda and
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