scieee Science in your language
[en] (orig)

Coulomb-driven flow of a dielectric liquid subject to charge injection by a sharp electrode

Abstract

Injection of charge by a sharp electrode into a surrounding dielectric liquid leads to Coulomb forces that set the liquid into motion. An analysis is presented of this motion in a small region around the edge of the electrode, which determines the injected current as a function of the far electric potential seen by this region. By using an injection law appropriate for nonpolar liquids, the analysis predicts an electric current that increases first exponentially and then as the power 7 3 of the harmonic part of the electric potential, sometimes with a range of multiplicity in between

Read accessible full text

Coulomb-driven flow of a dielectric liquid subject to charge injection by a sharp electrode

Author: Higuera, F.J.; Vázquez González, Pedro Ángel
Publisher: AIP Publishing
Year: 1999
DOI: 10.1063/1.870104
Source: https://idus.us.es/bitstreams/fbcc49cd-f438-476c-9d61-f53a760f2a38/download
Coulomb-d i en low o a dielec ic liquid subjec o cha ge injec ion
by a sha p elec ode
F. J. Higue aa)
E.T.S. Ingenie os Ae ona
´u icos, Pza. Ca denal Cisne os 3, 28040 Mad id, Spain
P. A. Va
´zquez
Uni e sidad de Se illa, Dep s. Elec o
´nica y Elec omagne ismo and Fı
´sica Aplicada, 41092 Se illa, Spain
~Recei ed 21 Janua y 1999; accep ed 23 Ma ch 1999!
Injec ion o cha ge by a sha p elec ode in o a su ounding dielec ic liquid leads o Coulomb o ces
ha se he liquid in o mo ion. An analysis is p esen ed o his mo ion in a small egion a ound he
edge o he elec ode, which de e mines he injec ed cu en as a unc ion o he a elec ic po en ial
seen by his egion. By using an injec ion law app op ia e o nonpola liquids, he analysis p edic s
an elec ic cu en ha inc eases i s exponen ially and hen as he powe 7
3o he ha monic pa o
he elec ic po en ial, some imes wi h a ange o mul iplici y in be ween. © 1999 Ame ican
Ins i u e o Physics. @S1070-6631~99!01207-6#
Elec ic conduc ion h ough a pu i ied dielec ic liquid
be ween a couple o elec odes subjec ed o a high po en ial
di e ence is o en domina ed by he mo ion o cha ge ca i-
e s injec ed a one o he wo elec odes by means o elec-
ochemical eac ions. In hese cases, he p esence o a space
cha ge ~o densi y q!in he elec ic ield Eexis ing in he
liquid leads o a Coulomb o ce qE ha induces a mo ion o
he liquid. Such mo ion enhances cha ge, momen um and
hea ans e , which is o in e es in a numbe o applica ions
including elec os a ic p ecipi a o s, elec ohyd odynamic
ion-d ag pumps, and elec ohyd odynamic lamina and u -
bulen mixing; see Re s. 1 and 2 o e iews. While s ong
ep oducible injec ions can be ob ained by using elec odia-
ly ic memb anes,3,4 weak and mode a e ep oducible injec-
ions in nonpola liquids5–7 a e p obably mo e impo an in
applica ions. In he i s case he cha ge densi y a he injec -
ing elec ode is nea ly independen o he local elec ic ield
~au onomous injec ion!, whe eas i is a apidly inc easing
unc ion o he elec ic ield in he second case. The injec ion
law q/q05
$
(E/E0)1/2K1@(E/E0)1/2#
%
21, whe e E5
u
E
u
,K1
is he modi ied Bessel unc ion o second kind and o de one,
and q0and E0a e cons an s, was p oposed by Felici and
Gosse6on he assump ion ha he a e limi ing p ocess o
injec ion is he ex ac ion o ions h ough he ield-dependen
ba ie in he so called image- o ce egion on he elec ode
su ace ~Scho ky e ec !.
Coulomb-d i en con ec ion be ween plane-pa allel elec-
odes has been much s udied; see, e.g., Re s. 8 and 9 and
e e ences he ein. Sha p o peaky elec odes, on he o he
hand, lead o high elec ic ields ha a e o in e es , o con-
ce n, in applica ions. A en and Haida a10 de e mined expe i-
men ally he I-Vcha ac e is ic o a kni e-plane elec ode as-
sembly in a closed cell, using he high elec ic ield as a
means o asce ain he ole o cha ge injec ion by he sha p
elec ode in he di e en egimes ound in hei expe imen s,
and Takashima e al.11 ca ied ou simila expe imen s and
app oxima e nume ical compu a ions o kni e-plane and
needle-plane elec ode con igu a ions. In bo h cases Cou-
lomb o ce leads o an elec ohyd odynamic plume, analo-
gous o a buoyancy-induced he mal plume, a om he in-
jec ing elec ode, whose s uc u e and s abili y ha e been
s udied elsewhe e ~Re s. 12–16!. Howe e , i is he low and
cha ge dis ibu ion in a egion a ound he elec ode ip o
size o he o de o i s cu a u e adius ha de e mines he
injec ed cu en o a gi en injec ion law q5 (E) a he
elec ode su ace. This low was discussed in Re . 16 and
will be u he analyzed he e unde he assump ions ha he
mo ion o he liquid is induced locally by Coulomb o ce,
a he han by he eci cula ion possibly exis ing in he bulk
o he cell, and ha he Reynolds numbe based on he cu -
a u e adius o he elec ode a i s ip and he cha ac e is ic
eloci y o he liquid ~see below!is small. Neglec ing he
ine ia o he liquid and he di usion o he cha ge, he equa-
ions and bounda y condi ions go e ning he s eady wo-
dimensional low a ound a pa abolic elec ode ip can be
w i en in nondimensional o m as ollows
¹2
c
52
, wi h 5~u, !5
S
]
c
]
y,2
]
c
]
x
D
,~1!
a!Elec onic mail: [email p o ec ed]
VOLUME 11, NUMBER 8 AUGUST 1999
PHYSICS OF FLUIDS
111070-6631/99/11(8)/2434/3/$15.00 2434 © 1999 Ame ican Ins i u e o Physics
¹2
1
]
q
]
x
]
]
y2
]
q
]
y
]
]
x50, ~2!
¹2
5q, wi h E5“
,~3!
“•@q~ 1
k
E!#50, ~4!
x512y2
4:
c
5
]
c
]
n5
50, q5
S
]
]
n
D
,~5!
and he a ield condi ions
c
;31/6
2J2/3 4/3~cos 2
3
u
2cos 4
3
u
!1•••
;22
35/6 J2/3 22/3 cos 2
3
u
1•••
;31/3J1/3 2/3 sin 2
3
u
1F`
h1•••
q50 a inle
6
,~6!
o (x,y)→`. He e xand ya e dis ances along he axis o
he pa abola and no mal he e o, measu ed om i s ocus and
scaled wi h wice i s cu a u e adius a he ip 0/2;
5(x21y2)1/2, and
u
5a c an(2y/x), wi h
u
5
p
/2 a x.0,
y50; and (
c
,
,
,q) a e he s eam unc ion, he o ici y,
he elec ic po en ial, and he cha ge densi y scaled wi h
(
e
Ec
2 0
2/
m
,
e
Ec
2/
m
,Ec 0,
e
Ec/ 0), espec i ely. He e
m
and
e
a e he liquid iscosi y and pe mi i i y, and Ecis a cha -
ac e is ic elec ic ield, depending on he injec ion law q
5 (E) and de ined by he condi ion (1)51 in nondimen-
sional a iables. In wha ollows he law q5exp
$
g
(E21)
%
,
wi h
g
cons an , will be used o de ini eness, hough he
esul s should be alid o any (E) inc easing apidly wi h
Ei
g
5d(ln )/dE
u
E51. Equa ions ~1!and ~2!a e he mass
and momen um conse a ion equa ions in he o ici y-
s eam unc ion o mula ion; he las wo e ms o Eq. ~2!a e
he cu l o he Coulomb o ce. Equa ion ~3!is Poisson’s law
o he elec ic po en ial and Eq. ~4!is he con inui y equa-
ion o he elec ic cha ge, which mo es wi h eloci y
1
k
E, whe e
k
is he cha ge mobili y nondimensionalized
wi h
e
Ec 0/
m
. The Reynolds numbe alluded o be o e is
Re5
e
Ec
2 0
2/
m
2, and o mula ion ~1!–~6! elies on he as-
sump ion Re!1.
The elec ic ield away om he injec ing elec ode is
domina ed by he space cha ge and i s image by he elec-
odes. This cha ge is con ined o a hin s eak a ound he
symme y plane by he ac ion o he con e ging low, which
in u n is domina ed by he Coulomb o ce ac ing on he
cha ged s eak. The a ield condi ions ~6! esul om he
balance o he Coulomb o ce and he iscous shea o ce on
he sides o he s eak. The i s o ce is ExJ/u, whe e, ad-
ancing ha
u
u
@
k
u
“
u
when x@1, J5limx→`
*
2`
`uqdy
is he elec ic cu en pe uni dep h o he elec ode ~ o be
ound as pa o he solu ion!, so ha J/uis he cha ge den-
si y in eg a ed ac oss he s eak, and Exis he elec ic ield a
he symme y plane, due mainly o he cha ged s eak and i s
image by he injec ing elec ode. This ield can be seen o be
o o de J/u. The second o ce is o o de u/x, and he
balance o he wo equi es u5O(J2/3x1/3) and Ex
5O(J1/3/x1/3). Since ¹2
5¹2
5¹4
c
50 ou side he
s eak, hese asymp o ic beha io s lead o he ha monic and
biha monic unc ions in ~6!.17 In he second e m o he
asymp o ic expansion o
in ~6!
h5221/2@(x21y2)1/2
1x#1/221 is an exac solu ion o he p oblem wi h q50 and
he pa ame e F`measu es he ha monic ield seen by he
egion o conce n. Finally
]
/
]
n5(
]
/
]
x11
2y
]
/
]
y)/(1
1y2/4)1/2 deno es he de i a i e no mal o he elec ode in
~5!.Equa ions ~1!–~4!we e ew i en in pa abolic coo di-
na es, disc e ized using second o de ini e di e ences, and
sol ed wi h a pseudo ansien me hod. Values o
g
anging
om 10 o 30 we e used in mos o he compu a ions. These
alues a e ep esen a i e o he limi
g
→`, in which he
ex eme sensi i i y o he cha ge densi y a he elec ode wi h
he elec ic ield leads o wo egions on he elec ode su -
ace: an injec ion egion whe e q.0 and E51, and he es
o he elec ode, whe e q50 and E,1. Figu e 1 shows Jas
a unc ion o F` o se e al alues o he nondimensional
mobili y
k
and o
g
.
As can be seen in Fig. 1, he elec ic cu en begins
inc easing e y apidly wi h F`, p esen s mul iplici y in a
ange o F`i
g
is su icien ly la ge, and se les o a powe
law when F`→`. On dec easing Jin he middle b anch, he
educ ion o he ield due o he space cha ge and i s image is
nea ly balanced by an inc ease o he ha monic ield, so ha
he ield on he elec ode dec eases e y li le, as equi ed by
he injec ion law when
g
is la ge. ~This desc ip ion and he
shape o he cu e depend on he manne he wo con ibu-
ions o he ield a e de ined, which is no unique.!In he
s eep lowe b anch he ha monic ield domina es. The esul s
o Fig. 1 a e alid e en i he cha ged s eak is nonhomoge-
neous o uns able beyond he egion analyzed he e, inso a
as he cha ac e is ic ime o i s e olu ion is la ge compa ed
wi h he local esidence ime (
m
/
e
Ec
2in dimensional a i-
ables!. Then F`is a slowly a ying unc ion o ime and a
S-shaped esponse may lead o jumps and hys e esis o he
cu en .
In he absence o space cha ge, he elec ic po en ial is
F`
hand he maximum elec ic ield is Emax5F`/2, a he
elec ode ip, so ha he condi ion Emax51 de ining he onse
o cha ge injec ion o
g
→`amoun s o F`52. This should
be he limi ing posi ion o he lowe u ning poin s in Fig. 1.
In addi ion, since
h;x1/2 away om he injec ing elec ode,
FIG. 1. Jas a unc ion o F` o
g
520 and
k
50.2, 0.5, 1, and 2, inc eas-
ing as indica ed by he a ow ~solid!, and o
k
51 and
g
510 ~do ed le !
and
g
530 ~do ed igh !. The dashed s aigh lines on he igh side a e he
asymp o es J5c
k
2/3F`
7/3 o
k
50.5, 1, and 2, wi h c51.3.
2435Phys. Fluids, Vol. 11, No. 8, Augus 1999 Coulomb-D i en Flow o a Dielec ic Liquid...
he onse ol age be ween he elec odes is V15O(R1/2),
whe e R@1 is he dis ance be ween he elec odes scaled
wi h 0.
In he asymp o ic limi F`→` he cha ge is con ined o
a hin laye on he elec ode su ace and o a s eak on he
symme y plane. Le qand
d
be he cha ac e is ic cha ge
densi y in he laye on he elec ode and he hickness o his
laye , qsand
d
s he co esponding magni udes in he s eak
a ~nondimensional!dis ances o o de uni y om he elec-
ode, and E5O(F`)@1 he cha ac e is ic elec ic ield.
The balance o Coulomb o ce and iscous o ce in oduced
be o e equi es now Eqs
d
s; , whe e is he cha ac e is ic
eloci y o he liquid. This eloci y ends o ze o a he elec-
ode su ace, being o o de cl5
d
and essen ially angen
o he su ace in he cha ged laye on he elec ode, whe e he
eloci y no mal o he su ace is o o de n5 cl
d
5
d
2
~ om he con inui y equa ion!. This la e eloci y pushes he
cha ge owa d he su ace agains he d i eloci y
k
E,
which is di ec ed away om he su ace. The balance o he
wo e ec s de e mines he hickness o he cha ged laye ,
p o iding he ela ion n;
k
E,o q
s
d
s
d
2
;
k
. On he o he
hand, conse a ion o he injec ed cha ge equi es J; qs
d
s
; clq
d
, whe e q;E/
d
om Poisson’s law in he cha ged
laye @whe e he elec ic ield mus dec ease om O(E)in
he ou e egion o essen ially O(1) a he su ace, specially
i
g
is la ge#. Thus qs
d
s;(q
d
) cl / ;E
d
, and elimina ing
qs
d
sbe ween his ela ion and he one coming om he bal-
ance o con ec ion and d i eloci y yields
d
;(
k
/E)1/3.
Then q;
k
1/3E4/3, ;
k
1/3E5/3, and J;
k
2/3E7/3. The las e-
sul is consis en wi h he powe law ela ions be ween he
cu en and he ol age ound in some expe imen s. A com-
pa ison wi h he nume ical solu ion o Eqs. ~1!–~6!is p e-
sen ed in Fig. 1, whe e he dashed lines a e J5c
k
2/3F`
7/3 ,
wi h c51.3 chosen o i he nume ical solu ions.
The main ea u es o he J–Vcha ac e is ic o he cell
p edic ed by he p esen model unde s a iona y condi ions
and
g
@1 can now be ou lined. Fi s , a ol age V.V1
5O(R1/2) is equi ed o injec ion. Second, since he i s
e m o he expansion o
in ~6!g ows wi h as e han he
second, he excess ol age necessa y o keep a s a iona y
cu en Jis V2V15O(J1/3R2/3), so ha J!1 while (V
2V1)!R2/3 and J@1 when V@R2/3. In he i s case he
ha monic ield domina es in he egion !1/J2@ om ~6!
wi h F`5O(1)], which sh inks when Vbecomes o
O(R2/3). In he second case F`5O(J3/7)@ aking
k
5O(1)], which is also la ge, and he ha monic ield domi-
na es in he expanding egion !J4/7. Thi d, his egion ends
up co e ing he whole cell when J5O(R7/4), co esponding
o V5O(R5/4), and he ela ion J5O(V3/R2) changes o J
5O(V7/3/R7/6) when V@R5/4. No ice ha F`
5O@max(1,J3/7)#is small compa ed wi h he alue i would
ha e in he absence o space cha ge, o O(V/R1/2), o any
ol age sa is ying V1!V!R5/4: The space cha ge is sc een-
ing he injec ing elec ode almos comple ely in his ange o
ol ages. The s abili y o he s a iona y low and he e ec s
o he ine ia o he liquid will be analyzed elsewhe e.
In summa y, an analysis has been ca ied ou o he
c eeping low induced by Coulomb o ces in a dielec ic liq-
uid a ound a sha p wo-dimensional elec ode injec ing
cha ge wi h a law q5 (E) ha e lec s he high sensi i i y
o cha ge injec ion wi h he elec ic ield. The analysis leads
o a cu en -ha monic ield ela ionship (J2F`) ha may be
mono onically inc easing o S-shaped, ea u es an injec ion
onse when
g
→`, and becomes a powe law J;F`
7/3 in he
space cha ge-limi ed injec ion limi F`→`. An analogous
analysis o pa aboloidal elec odes leads o he same 7
3law
up o loga i hms.
ACKNOWLEDGMENTS
We a e g a e ul o P o s. A. Cas ellanos and A. T. Pe
´ ez
o use ul discussions. This wo k was suppo ed by DGICYT
g an PB95-0008.
1A. Cas ellanos, ‘‘Coulomb-d i en con ec ion in elec ohyd odynamics,’’
IEEE T ans. Elec . Insul. 26, 1201 ~1991!.
2P. A en, ‘‘Elec ohyd odynamic ins abili y and mo ion induced by in-
jec ed space cha ge in insula ing liquids,’’ IEEE T ans. Dielec . Elec .
Insul. 3,1~1996!.
3G. B ie
` e and J. P. Gosse, ‘‘Injec ion d’ions dans les liquides polai es,’’ J.
Chim. Phys. 65, 725 ~1968!.
4N. J. Felici and R. E. Tobaze
´on, ‘‘Cha ge ca ie elimina ion and p oduc-
ion by elec o-dialy ic polyme s in con ac wi h dielec ic liquids,’’ J.
Elec os . 11, 135 ~1981!.
5A. Dena , B. Gosse, and J. P. Gosse, ‘‘Ion injec ions in hyd oca bons,’’ J.
Elec os . 7, 205 ~1979!.
6N. J. Felici and J. P. Gosse, ‘‘Injec ion d’ions pa des e
´lec odes me
´ al-
iques dans les hyd oca bu es liquides de e
´sis i i e
´e
´le ee
´,’’ Re . Phys.
Appl. 14, 629 ~1979!.
7A. Alj, A. Dena , J. P. Gosse, B. Gosse, and I. Nakamu a, ‘‘C ea ion o
cha ge ca ie s in nonpola liquids’’ IEEE T ans. Elec . Insul. 20, 221
~1985!.
8J. M. Schneide and P. K. Wa son, ‘‘Elec ohyd odynamic s abili y o
space-cha ge-limi ed cu en s in dielec ic liquids. I. Theo e ical s udy,’’
Phys. Fluids 13, 1948 ~1970!.
9R. Chico
´n, A. Cas ellanos, and E. Ma ı
´n, ‘‘Nume ical modelling o
Coulomb-d i en con ec ion in insula ing liquids,’’ J. Fluid Mech. 344,43
~1997!.
10P. A en and M. Haida a, ‘‘Elec ical conduc ion and EHD mo ion o
dielec ic liquids in a kni e-pla e elec ode assembly,’’ IEEE T ans. Elec .
Insul. 20, 187 ~1985!.
11T. Takashima, R. Hanaoka, R. Ishibashi, and A. Oh subo, ‘‘I-Vcha ac-
e is ics and liquid mo ion in needle- o-plane and azo -blade- o-plane
con igu a ions in ans o me oil and liquid ni ogen,’’ IEEE T ans. Elec .
Insul. 23, 645 ~1988!.
12F. M. J. McCluskey and A. T. Pe
´ ez, ‘‘The elec ohyd odynamic plume
be ween a line sou ce o ions and a la pla e,’’ IEEE T ans. Elec . Insul.
27, 334 ~1992!.
13P. A en, B. Mal aison, and M. Zahn, ‘‘Elec ohyd odynamic plumes in
poin -plane geome y,’’ IEEE 11 h ICDL, Baden, Swi ze land ~1993!.
14A. T. Pe
´ ez, P. A. Va
´zquez, and A. Cas ellanos, ‘‘Dynamics and linea
s abili y o cha ged je s in dielec ic liquids,’’ IEEE T ans. Ind. Appl. 31,
761 ~1995!.
15A. T. Pe
´ ez, P. A. Va
´zquez, and A. Cas ellanos, ‘‘The mal and elec ohy-
d odynamical plumes. A compa a i e s udy,’’ Phys. Fluids 8, 2091 ~1996!.
16P. A. Va
´zquez, ‘‘Dina
´mica y es abilidad de penachos elec ohid odina
´mi-
cos,’’ Doc o Thesis, Uni e sidad de Se illa, Spain ~1998!.
17The scaling and he bounda y condi ions a he elec ode (
u
'0) imply
;A 2/3 sin 2
3
u
and
c
;B 4/3(cos 2
3
u
2cos 4
3
u
), whence Ex5
]
/
]
u
u
5
p
5321/2A/ 1/3,u5 21
]
c
/
]
u
u
u
5
p
531/2B 1/3, and he iscous s ess on he
sides o he s eak is 2 22
]
2
c
/
]
u
2
u
u
5
p
54
3B/ 2/3. On he o he hand, us-
ing he exp ession J/u5J/(31/2B 1/3) o he cha ge in he s eak, elec o-
s a ics gi es Ex5J/(2B 1/3) and he Coulomb o ce ExJ/u5J2/(2
331/2B2 2/3). The cons an s Band Aused in ~6! hen ollow by equa ing
his o ce o he iscous o ce and by equa ing he wo exp essions o Ex
abo e.
2436 Phys. Fluids, Vol. 11, No. 8, Augus 1999 F. J. Higue a and P. A. Vazquez