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Numerical optimization of hybrid dielectric/HTS resonators for surface impedance evaluation of HTS films

Abstract

This work describes an alternative to the traditional dielectric resonator topology used for measuring surface impedance in high temperature superconducting (HTS) films. A gap is introduced above the dielectric so that only the lower film is in direct contact with it. This arrangement has been used extensively for mechanical tuning of dielectric resonators and, when used for surface impedance measurement, it can be designed to make the losses in the upper film small relative to the overall resonator losses. Then, measured results are mostly due to one of the films and not the average of two. The specifics of a resonator design for measuring 2-inch wafers are presented. An analysis and optimization of the resonator is done using a numerically efficient mode-matching algorithm.

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Numerical optimization of hybrid dielectric/HTS resonators for surface impedance evaluation of HTS films

Author: Collado Gómez, Juan Carlos,Gonzalo, David,Rozan, Edouard,O'Callaghan Castellà, Juan Manuel,Sans, C
Year: 1999
DOI: 10.1109/77.784844
Source: https://upcommons.upc.edu/bitstream/2117/98257/1/00784844.pdf
1956
IEEE
TRANSACTIONS
ON
APPLIED SUPERCONDUCTIVITY, VOL.
9,
NO.
2,
JUNE
1999
Nume ical Op imiza ion o Hyb id Dielec ic/HTS Resona o s o Su ace
Impedance E alua ion
o
HTS Films
C. Collado,
D.
Gonzalo, E. Rozan,
J.M.
O’Callaghan.
Uni e si a Poli ecnica de Ca alunya. Campus No d UPC-D3. Ba celona
08034,
Spain.
C.
Sans
Uni e si a de Vic. C/ Mi ama ges
4.
Vic
08500,
Spain
Abs ac -
This wo k desc ibes an al e na i e o he
adi ional dielec ic esona o opology used o
measu ing su ace impedance in High Tempe a u e
Supe conduc ing (HTS) ilms.
A
gap is in oduced abo e
he dielec ic
so
ha only he lowe ilm is in di ec
con ac wi h i . This a angemen has been used
ex ensi ely o mechanical uning o dielec ic esona o s
and, when used o su ace impedance measu emen , i
can be designed o make he losses in he uppe ilm small
ela i e
o
he o e all esona o losses. Then, measu ed
esul s a e mos ly due o one o he ilms and no he
a e age o wo. The speci ics o a esona o design o
measu ing 2-inch wa e s a e p esen ed. An analysis and
op imiza ion o he esona o is done using a nume ically
e icien mode-ma ching algo i hm.
I.
INTRODUCTION
Commonly used echniques o e alua ing su ace
impedance in HTS hin ilms a e based on measu emen s o
esona o s on ei he pa e ned, plana s uc u es
o
in a
dielec ic esona o ca i y in which he uppe and lowe walls
a e made o
HTS
ilms and a e in con ac wi h he dielec ic
[l].
Only he la e app oach is non-des uc i e, bu i yields
he a e age su ace esis ance o wo ilms. Thus, o measu e
a sample wi h unknown p ope ies, i has o be pai ed wi h a
e e ence sample o de e mine i s su ace impedance. The
deg ee o accu acy o which he su ace esis ance o he
e e ence is known can be a signi ican sou ce o e o in
hese measu emen s. The e o e, o he non-des uc i e
me hods need o be explo ed u he .
11.
HYBRID
DIELECTRICIHTS
RESONATOR
The dielec ic esona o opology unde s udy is a
modi ica ion o he adi ional dielec ic-HTS one
[
11, whe e
a gap is in oduced be ween he uppe endpla e and he
dielec ic cylinde (Fig.
1).
The pu pose o in oducing his
gap is o lowe he
RF
losses in he uppe ilm and
Manusc ip ecei ed Sep embe
15,
1998
This
wo k
has been unded by he Spanish Minis y o Educa ion and
Cul u e h ough CICYT g an MAT95-1038-C02-02 and by he Ca alan
ClRlT
h ough g an SGROOO43.
Coupling
p Dba1
Sapphi e/
c ys ol
.G-
I
,
U‘
U
Fig.
1.
Dielec ic esona o s uc u e. De ini ions o dielec ic
heigh
(hd),
dielec ic adius
( d)
and gap size
(h,)
concen a e hem in he lowe one,
so
ha i s
R,
is he la ges
con ibu ing ac o o he o al losses o he ca i y.
Expe imen al use o his ype o ca i y o measu emen o
R,
is men ioned in [2], bu no design de ails a e gi en.
Am
analy ical s udy o his opology, based on an a.xia1 mode-
ma ching me hod wi h a single mode is p esen ed in [3]. No
desc ip ion is gi en in any o hese wo ks o he p ocedu e o
op imize he ca i y o
R,
de e mina ion pu poses.
In
[3] i is
poin ed ou ha , as he uppe gap
is
inc eased, he
elec omagne ic ields on he no mal me al side walls also
inc ease,
so
he con ibu ion o he RF losses
o
he uppe
ilm a e educed a he expense o inc easing hose o he side
walls. Fo
R,
de e mina ion, an op imal heigh exis s o
.a
gi en esona o size and a gi en diame e o he
supe conduc ing endpla es, o which he a io o he
RI3
losses in he lowe pla e o he o e all losses in he ca i y is
maximum. This op imum may be ound using an e icien.
mode-ma ching code
[4],
which calcula es he
elec omagne ic ield dis ibu ion in s uc u es wi h azimu all
symme y. The algo i hm is no es ic ed o small gap sizes
and can be used
o
op imize he whole s uc u e (gap size:,
dielec ic heigh and dielec ic diame e ) o a gi en diame e
o he supeconduc ing wa e s o be measu ed.
Re e ence [2] p oposes a su ace esis ance de e mina ion
p ocedu e based in wo consecu i e measu emen s o quali y
ac o s in which he op and bo om samples a e ‘exchangecl.
The op imiza ion p oposed he e migh make his unnecessa y,
so
ha a single measu emen and a ough es ima e o he
su ace esis ance o he op ilm and side walls migh lead o
an accu a e de e mina ion o he su ace esis ance o he
lowe ilm.
1051-8223/99$10.00
0
1999
IEEE
1957
Fig. 2. Radial egions (A,B,C) and axial laye s (1,2,3)
conside ed by he mode-ma ching algo i hm. Dielec ic
pe mi i i y can be de ined independen ly
o
each
o
he
9
cells
(AI..C3).
A.
Full-wa e adial mode-ma ching me hod
The so wa e de eloped
[4]
can analyze up o h ee
di e en adial egions, each one di ided in o h ee di e en
laye s (Fig.2). The dielec ic cons an in each egion and laye
can be se independen ly, and he whole olume analyzed is
assumed o be enclosed by conduc ing walls. Fields in e e y
adial egion a e exp essed as an in ini e se ies o pa icula
solu ions
o
he wa e equa ion in cylind ical coo dina es.
Azimu al and axial eigen unc ions a e ha monic unc ions
while adial eigen unc ions a e Bessel unc ions, which mus
be chosen app op ia ely o a oid singula i y in he axis
( egion A), ul ill bounda y condi ions on he ex e nal walls
( egion
C),
o p o ide con inui y be ween adjacen egions
( egion
B).
The eigen alues o each adial egion a e ound
by sol ing a pai o anscenden al equa ions ela ed o he
h ee-laye p oblem.
A
sys em o equa ions is hen ound
by
o cing con inui y condi ions
o
he angen ial ields be ween
adial egions
A
and B, and
B
and
C,
om which he
coe icien s
o
he mode expansion a e ound. In ou case
12
modes a e su icien . Fig.
3
illus a es he ield and cu en
dis ibu ions o a sapphi e dielec ic wi h a 12
mm
diame e
and a
6
mm
heigh .
B.
Op imiza ion. Basics and al e na i es
Fo
R,
de e mina ion, he op imal dimensions
o
he ca i y
in Fig.
1
a e hose ha make he losses o he lowe pla e
dominan wi h espec o he o he ype
o
losses. This
is
equi alen o maximizing
Qo/Qlc,w,
whe e:
U
is he o al s o ed ene gy in he ca i y,
Pd
he o al
dissipa ed powe ,
Pd-/ow
he powe dissipa ed in he lowe
wall, and
Qo
he unloaded quali y ac o . Bo h he o al ene gy
U
and he dissipa ed powe s
Pd
and
P l-lOw
can be calcula ed
om he ield dis ibu ion inside he ca i y wi h p ope ly
de ined su ace and olume in eg als o he elec omagne ic
ields
[5].
De ini ions analogous o ha
o
Qlclw
in (1) can be
used o
Qu/,,
Q.,d
and
Qd
which accoun o he losses in he
uppe wall, side wall, and dielec ic espec i ely. Thus, he
unloaded quali y ac o can be w i en as:
...._..........
....
,
I,,................
I#,,.-.........
.
...
Il .
.............
I ,.-
]I!..-::::::::'
::::
'id,
........
..
-),,,..........
/j/i
,,,........
.
$:j:::::;:;;:;;:
hzj:::
:
::
:
:
:
:
:
:
:
I
-.%.-A
"
..
.
.
.
.
. .
.
.
.
. .
.
-+c+
4-
-
.
.
. . . .
.
.
.
.
.
Fig. 3. Field and cu en dis ibu ions in he ca i y wi h
a
TEOI
mode and
a
sapphi e dielec ic. Bo om pla e diame e is 48mm, dielec ic diame e is
12mm and dielec ic heigh
is
6mm. The dashed line ep esen s he sapphi e
ou line.
(Top)
Radial cu
o
he esona o showing magne ic ield lines.
(Bo om)
Cu en s a he su ace
o
he lowe HTS ilm.
The ele ance o maximizing
Q0/Qluw
is due o he ac ha
his de ines he sensi i i y o he sys em:
(3)
which can. be p o en om
(1)
and
(2),
and om he
p opo ionali y be ween and
R,.
Also,
as
Qo/Qlc,w
is
inc eased, he accu acy in es ima ing
Q,,,
QSd
and
Qd
has a
lesse e ec on he
R,y
p edic ed om he measu ed
Qo
and
(2).
A
so wa e code has been de eloped, which includes he
elec omagne ic mode-ma ching algo i hm desc ibed
p e iously, and is capable o calcula ing
Q clw
,
Q,,
QSd
and
Qd
as a unc ion o dielec ic heigh
(hJ,
dielec ic adius
( d)
and gap size
(h,)
(Fig.
1).
To
es i , he ca i y dimensions
gi en in
[2]
we e used, and he code esul s we e compa ed
wi h hose in Table
I
in ha e e ence. The ag eemen is
excellen , as shown in Table I o his wo k.
The so wa e de eloped can use se e al s a egies o a y
hd,
d
and
h,
in he sea ch o a maximum o
Qo/QlcIw
:
1)
a ia ion o he gap size o a gi en ( ixed) dimension o he
dielec ic;
2)
exhaus i e sea ch a ying
hd,
d
and
h,
o e a
speci ied ange, wi h a speci ied inc emen al s ep size; and
3)
1958
-D-
Q-Side
wall
(Qsd)
~
"i
j_
+
....
4
-
Q-Uppe wall (Qup)
'
.i..
....
~.
I.
:.
i..
........
:
-
.
Q-Dielec ic (Qd)
~
-
..
.
--+-.Q~/QIow~
.
,.
F
,<
j
.TABLE
I
COMPARISONS
BETWEEN
121
AND
THIS
WORK
Glow
is de ined
as
he p oduc
o
he su ace esis ance
o
he lowe
pla e and
Plow;
Cup
and
Gsd
a e
de ined simila ly.
(GHz) Glow GUP Gsd
PI
9.5 546 4.90e3 1.15e6
This wo k 9.510 541 4.81e3 l.lle6
E o
%
0.8%
1.7%
3.3%
,.
,.
-'
I
..
-.
.......
+
.....;
...........................................
I
+,
L.-
--
...............
&
..................................
.>
+-I---
__
x-
-.
1
*.
- -&--*----+-;
;A'
I
-
/I
y;
..
,,
.
,-
~,
.
I-
;
:
.......
~
................................
g adien sea ch using
Ma lab [6].
In his p ocess i is assumed
ha he uppe and lowe walls a e made o YBa2Cu3O7.8
(YBCO), and he side walls o a no mal me al (usually OFHC
coppe , bu i can be changed by he use ). Thei
R,T
is scaled
as he calcula ed esonan equency
o
he ca i y changes due
o a ia ions in
hd, d
and
h,.
The scaling law is aken as
*
o YBCO and
o he me al, and he alues o
R,y
a
lOGHz
and
77K
a e aken as
300@
(YBCO) and
9mQ
(Cu)
[7] espec i ely. The equency dependence o he loss
angen o sapphi e is neglec ed, aking ank4
[8]
h oughou he op imiza ion.
C.
Op imum gap o ixed dielec ic and wa e sizes
10
i
;
[1
*i-
xi.-
A
-/
Y
U.
11'1,,,,111,,,,,111,1,,
Fig.
4
shows he esul s o he gap heigh op imiza, ion o a
dielec ic wi h
hp6mm, p6mm
and a 2 inch wa e whe e
only an a ea o 48mm in diame e is exposed
o
he
elec omagne ic ields in he ca i y. This igu e indica es
ha , while he losses in he side walls a e s ongly dependen
on
h,,
his dependence is mode a e in he uppe wall, and
weak in he dielec ic and lowe wall. The e o e, he
op imum heigh ep esen s a ade-o be ween he losses in
he uppe wall and hose in he side wall. This esul s in an
op imum gap o
h,=6mm
and
Qo/Q1,,,,=O.85,
which essen ially
coincides wi h he esul s epo ed in
[2].
As
shown la e ,
subs an ial imp o emen s can be made by adjus ing
h,l,
d
and
h,
join ly.
Finally, Fig.
5
shows ha hese esul s deg ade !s ongly
i
he diame e o me al side wall is educed.
D.
Subs i u ion o he uppe HTSpla e by a coope
one
Unsuccess ul a emp s ha e been made a ep lacing he
YBCO in he uppe wall by coppe . E en when he gap
heigh op imiza ion p ocess was pe o med aking in o
accoun he new
R,,
o he uppe pla e, he sensi i i y
(Qo/Ql(,,,)
alues we e oo low o allow an (accep able
accu acy in he de e mina ion o he
R,,
o he bo oin pla e.
Inl
o he wo ds, he gap can ne e be high enough o eplace he:
uppe ilm by a no mal me al wi hou making i
a
dominani.
sou ce o loss in he ca i y and ende ing i useless €o su ace:
esis ance de e mina ion. Fig.
6
shows he e ec s o his
subs i u ion in he sensi i i y
(Qo/Q,,J.
When dimensions o he wa e and he dielec ic a e
known and ixed, only
h,
needs o be a ied o ind a
maximum o
Qo/Q o,,,.
This is done o wo easons: o
explo e a possible imp o ed design o he ca i y in [2] (while
main aining he sapphi e used); and
o
ind a good ini ial se
o alues o
hd, d
and
h,
om which a second op imiza ion
can be done using a g adien sea ch in which all h ee
a iables a e allowed o change.
E.
Join op imiza ion o hd, d
and
h,
The alues
o
hd, d
and
h,
ha e been op imized using wo
pa allel app oaches: a g adien op imiza ion and an
IO"
1
O'O
1
0'
1
o6
1
0.8
1
o8
0.6
Q
.
gi
4
0.4
0.2
0
Fig. 4. Dependence
o
Qw,
elow,
Qsd
wi h gap heigh
(h,).
The
op imum heigh
(max.
QO
/Q&
ep esen s
a
ade-o be ween he
losses in he uppe and side walls
(elq,
Qsd),
whose dependence on h,
is much s onge han ha
o
he
lowe wall
(elow)
and dielec ic
(Qd).
The maximum
o
Qo/QlOw
is a h,=6mm.
0.8
0.6
8
.
0.4
0.2
Ca i y adius
( n n)
Fig. 5. Dependence
o
Qw,
elow,
Q,Td
wi h ca i y adius.
As
he adius
is
dec eased, losses in he side walls inc ease, become dominan , and
deg ade
QO
/el(,,,,.
Gap heigh is hg=6mm.
As
in Fig.
4.
dielec ic
heigh is h~6mm
1959
Fig.
6.
De e io a ion
o
he sensi i i y
(Qo/QlOw)
as
he alue
o
R,
o
he
uppe sample is inc eased. A s ong deg ada ion occu s o he ange o
R,T
alues co esponding o coope a 77K a he esonan equencies o
he ca i y (abou
10
mn).
Fo hese alues o
Rs
in he uppe wall, he
Qo/Qim
is oo low
o
de e mina ion o he
R,y
o he lowe HTS ilm.
exhaus i e sea ch o e a b oad ange o hd,
d
and h, o ensu e
ha he g adien op imiza ion did no s op a a local
maximum o Qo/Qbw.
The exhaus i e sea ch was done om 2mm< hdlOmm,
3mm< 614mm and 1mm<hg<15mm.
A
maximum was ound
a hd=2mm, ~5mm and h,=6mm wi h Qo/Ql,,,~0.94. The
sea ch showed ha his op imum alue would deg ade sha ply
when hd was dec eased beyond i s op imum alue. Howe e ,
he dependence wi h hd and
d
was much weake ,
G adien op imiza ions we e un s a ing om se e al
alues, including
he
ones
om
Sec .
11-C.
They
all
eached
simila alues
o
Qo/Q o,,,. The bes one was he one s a ed
om hs2mm, d=5mm and h,=6mm ( he op imum o he
exhaus i e sea ch), which was used o ine- une he p e ious
sea ch esul ing in hd=l.7mm, &.Omm and hg=4.6mm wi h
Qo/Qlow
=0.95. In o he wo ds, i
no
o he losses a e
conside ed in a ca i y wi h hese dimensions, only a
5%
o e es ima ion o he su ace esis ance o he lowe sample
will be made, and his may be g ea ly wi h es ima es o he
su ace esis ance o he side walls, uppe
ilm
and dielec ic
loss
angen .
111.
CONCLUSION
An op imiza ion o he image dielec ic esona o ca i y
has been done by nume ical echniques. The so wa e
de eloped o he op imiza ion has been c oss-checked wi h
p e iously published esul s. The op imized ca i y should be
allow he de e mina ion o su ace esis ance o
YBCO
wi h
an e o lowe , han
5%
i no o he sou ces o
RF
loss
in
he
ca i y a e aken in o accoun .
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L.
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Zucca o, N. Klein, A.
G.
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Tellman, N. Klein,
U.
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