On the black-box explainability of object detection models for safe and trustworthy industrial applications
Abstract
A. Andres, I. Laña and J. Del Ser receive support from the ULTIMATE project (ref. 101070162) funded by the European Commission under the HORIZON-CL4-DIS program (HORIZON-CL4-2021-HUMAN-01). J. Del Ser and I. Laña also acknowledge funding from the Basque Government (MATHMODE, IT1456-22).
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Resea ch pape
On he black-box explainabili y o objec de ec ion models o sa e and
us wo hy indus ial applica ions
Alain And es a,b,∗, Ai o Ma inez-Se asa, Ibai Lañaa,b, Ja ie Del Se a,c
aTECNALIA, Basque Resea ch and Technology Alliance (BRTA), Mikele egi Pasealekua 2, Donos ia-San Sebas ian, 20009, Spain
bUni e si y o Deus o, 20012, Donos ia-San Sebas ián, Spain
cUni e si y o he Basque Coun y (UPV/EHU), Bilbao, 48013, Spain
A R T I C L E I N F O A B S T R A C T
Keywo ds:
Explainable A ificial In elligence
Sa e A ificial In elligence
T us wo hy A ificial In elligence
Objec de ec ion
Single-s age objec de ec ion
Indus ial obo ics
In he ealm o human-machine in e ac ion, a ificial in elligence has become a powe ul ool o accele a ing
da a modeling asks. Objec de ec ion me hods ha e achie ed ou s anding esul s and a e widely used in c i ical
domains like au onomous d i ing and ideo su eillance. Howe e , hei adop ion in high- isk applica ions,
whe e e o s may cause se e e consequences, emains limi ed. Explainable A ificial In elligence me hods aim
o add ess his issue, bu many exis ing echniques a e model-specific and designed o classifica ion asks,
making hem less effec i e o objec de ec ion and difficul o non-specialis s o in e p e . In his wo k we
ocus on model-agnos ic explainabili y me hods o objec de ec ion models and p opose D-MFPP, an ex ension
o he Mo phological F agmen al Pe u ba ion Py amid (MFPP) echnique based on segmen a ion-based masks
o gene a e explana ions. Addi ionally, we in oduce D-Dele ion, a no el me ic combining ai h ulness and
localiza ion, adap ed specifically o mee he unique demands o objec de ec o s. We e alua e hese me hods
on eal-wo ld indus ial and obo ic da ase s, examining he influence o pa ame e s such as he numbe o
masks, model size, and image esolu ion on he quali y o explana ions. Ou expe imen s use single-s age objec
de ec ion models applied o wo sa e y-c i ical obo ic en i onmen s: i) a sha ed human- obo wo kspace whe e
sa e y is o pa amoun impo ance, and ii) an assembly a ea o ba e y ki s, whe e sa e y is c i ical due o he
po en ial o damage among high- isk componen s. Ou findings e ince ha D-Dele ion effec i ely gauges he
pe o mance o explana ions when mul iple elemen s o he same class appea in a scene, while D-MFPP p o ides
a p omising al e na i e o D-RISE when ewe masks a e used.
1. In oduc ion
In ecen yea s, A ificial In elligence (AI) has eme ged as a ans-
o ma i e o ce ac oss a ious domains, especially in human-machine
in e ac ion, whe e i has enabled significan ad ancemen s in da a-
d i en decision-making p ocesses. Among hese ad ances, objec de-
ec ion has become a key componen , finding applica ion in c i ical
a eas such as au onomous d i ing, secu i y su eillance, indus ial au-
oma ion, and obo ics [45,22]. S a e-o - he-a objec de ec ion mod-
els, including Fas e -RCNN [28], DETR [6], and he YOLO se ies [37],
ha e demons a ed imp essi e pe o mance in iden i ying and localiz-
ing objec s wi hin images. Despi e hei success, he adop ion o hese
models in highly sensi i e en i onmen s emains limi ed, pa icula ly
in domains whe e e o s could esul in se ious consequences such as
inju y, equipmen damage, o ope a ional ailu es. One o he p ima y
* Co esponding au ho a : TECNALIA, Basque Resea ch and Technology Alliance (BRTA), Mikele egi Pasealekua 2, Donos ia-San Sebas ian, 20009, Spain.
E-mail add ess: [email p o ec ed] (Alain And es).
easons o his hesi ancy is he black-box na u e o objec de ec o s
implemen ed as Deep Lea ning models, which o da e amoun o he ma-
jo i y o p oposals in he li e a u e. The in e nal ac i a ions o hese a e
no inhe en ly in e p e able, making i challenging o end-use s o us
he p edic ions issued by objec de ec o s, especially in high- isk en i-
onmen s ope a ing in open-wo ld en i onmen s such as au onomous
ehicles and indus ial obo ics.
In his con ex , he field o Explainable AI (XAI) [5] aims o en-
hance he in e p e abili y o AI sys ems by hei audience and ul ima ely,
o enhance he use ’s us in he ou pu o AI-based sys ems. Lea ing
aside he ca ego y o anspa en AI models (which a e inhe en ly in e -
p e able and do no equi e any explana ions o a use o unde s and
how hey wo k), explainabili y me hods in XAI can be b oadly ca ego-
ized in o whi e-box and black-box app oaches. Whi e-box XAI me hods
equi e access o he in e nal wo kings o he model, such as weigh s,
h ps://doi.o g/10.1016/j. ineng.2024.103498
Recei ed 24 Oc obe 2024; Recei ed in e ised o m 14 No embe 2024; Accep ed 21 No embe 2024
Resul s in Enginee ing 24 (2024) 103498
2
A. And es, A. Ma inez-Se as, I. Laña e al.
ac i a ions, o g adien s (e.g., G ad-CAM [34]). While hese me hods
can p o ide powe ul insigh s, hey a e o en limi ed by hei depen-
dence on specific model a chi ec u es, making hem difficul o gene al-
ize ac oss diffe en models and less accessible o use s un amilia wi h
AI esea ch/ ools. In con as , black-box XAI me hods ea he model
as an opaque en i y, p o iding explana ions based solely on he mod-
el’s inpu -ou pu beha io wi hou equi ing any access o i s in e nal
componen s. Howe e , mos black-box XAI me hods a e designed o
classifica ion asks a he han o objec de ec ion [29,19,25,3].
While classifica ion models p oduce a single label pe image, ob-
jec de ec ion models mus iden i y and localize mul iple objec s wi hin
an image. The e o e, hey need o explain no only he class p edic ion
o each de ec ed objec – wha hey de ec – bu also he spa ial ea-
soning behind he bounding boxes ha define he objec ’s loca ion –
whe e he objec is posi ioned wi hin he image. Balancing hese dual
aspec s complica es he explana ion p ocess and equi es mo e sophis-
ica ed echniques han hose used o classifica ion asks.
In his pape , we add ess he gap in XAI me hods o objec de ec ion
by ocusing on model-agnos ic, black-box XAI echniques. We p opose and
e alua e no el black-box XAI me hods and XAI me ics ha a e speci -
ically ailo ed o objec de ec ion models, wi hou equi ing access o
in e nal model de ails. Ou p oposed me hods a e gene alizable o objec
de ec ion amewo ks beyond hose u ilized in ou expe imen s. Speci -
ically, he con ibu ions o his wo k can be summa ized as ollows:
•We o mally define a quan i a i e e alua ion me ic, D-Dele ion,
which ex ends he exis ing Dele ion me ic [4,25] p oposed o classi-
fica ion asks. This me ic is adap ed o handle he unique challenges
o objec de ec ion, including localiza ion (as seen in Fig. 4), which
is o u mos impo ance when mul iple ins ances o he same objec
appea in he same scene.
•By using he simila i y sco e o D-RISE [26], we analyze mul iple
mask gene a ion me hods’ pe o mance and in oduce D-MFPP, an
ex ension o MFPP [42] o iginally de eloped o classifica ion asks.
D-MFPP u ilizes segmen a ion-based mask gene a ion o imp o e ex-
plana ions o objec de ec ion models.
•We analyze he impac o key pa ame e s, such as image dimensions
and he model sizes wi hin he YOLO 8 a chi ec u e u ilized in ou
expe imen s, which can significan ly influence he quali y o he e-
sul ing explana ions.
•Las bu no leas , we acili a e he b oade adop ion o he de eloped
echniques o objec de ec ion in eal-wo ld use cases by eleasing he
code publicly in a eposi o y: h ps://gi hub .com /aklein1995 /d ise _
dm pp _ddele ion.
The emainde o his pape is s uc u ed as ollows: in Sec ion 2, we
fi s e iew li e a u e ela ed o XAI o objec de ec ion. In Sec ion 3,
we p o ide he necessa y backg ound on objec de ec ion and XAI o
amilia ize he eade wi h he key concep s used in he defini ions o
D-RISE and Dele ion. Nex , Sec ion 4p esen s he expe imen al se up, in-
cluding da ase s, objec de ec ion aining configu a ion, employed XAI
me hods, and e alua ion me ics. In his sec ion we also in oduce ou
p oposed D-MFPP me hod and D-Dele ion me ic. We discuss ou esul s
in Sec ion 5. Finally, Sec ion 6concludes he pape wi h a summa y o
ou key findings and di ec ions o u u e esea ch.
2. Rela ed wo k
Be o e p oceeding wi h he ma e ials and no el me hods in oduced
in his wo k, we fi s pause b iefly a XAI me hods, ocusing on hose
used o objec de ec ion asks and pu o p ac ice in indus ial applica-
ions:
XAI me hods. As s a ed in he in oduc ion, XAI offe s insigh s in o
he p ocedu e ollowed by an AI-based sys em o elici hei ou pu s,
enabling end-use s o unde s and and e en ually us he decisions ou -
pu by he AI-based sys em g ounded on objec i e da a [3]. To da e, he
majo i y o XAI me hods a e designed o models lea ned o add ess clas-
sifica ion asks. Fo ins ance, CAM-based me hods like G adCAM [34],
G adCAM++[7]and In eg a ed G adien s [36] quan i y and a ibu e
he pixel-wise impo ance o a gi en inpu acco ding o he g adien s
wi h espec a a ge class. Mo eo e , making use o backp opaga ion,
LRP [20] calcula es he con ibu ion ha a neu on has wi h neu ons
in consecu i e laye s o ge ele ance sco es. In con as , pe u ba ion-
based echniques wo k by occluding ce ain pa s o he inpu and ana-
lyzing i s impac in he p edic ions. Wi hin his ype o echniques, LIME
[29], app oxima es a NN wi h an in e p e able model; SHAP [19]as-
signs impo ance alues o each inpu ea u e based on Shapley alues;
RISE [25] gene a es saliency maps by p obing he model wi h andomly
masked e sions o he inpu image; and MFPP [42] gene a es masks
by di iding he inpu image in o mul i-scale supe pixels. None heless,
none o hem ha e been explici ly ex ended o objec de ec ion asks
–wi h he excep ion o RISE, which has been adap ed o his pu pose–
al hough echniques like SHAP can also be u ilized o eg ession p ob-
lems.
XAI me hods o objec de ec ion models. In ecen imes, a sca ci y
o XAI app oaches has been p oposed o suppo he in e p e abili y o
complex objec de ec ion models. SODEx [33]is a me hod capable o ex-
plaining any objec de ec ion algo i hm using classifica ion explaine s,
demons a ing how LIME can be in eg a ed wi hin YOLO 4, a a ian
o he YOLO amily o single-s age objec de ec o s. Simila ly, D-RISE
[26] ex ends RISE’s mask gene a ion echnique by in oducing a new
simila i y sco e ha assesses bo h he localiza ion and classifica ion as-
pec s o objec de ec ion models. Mo e ecen ly, D-CLOSE [38] enhances
D-RISE by p oducing less noisy explana ions. Along wi h o he me hod-
ological imp o emen s, D-CLOSE uses mul iple le els o segmen a ion in
he mask gene a ion phase. O he app oaches ocusing on hie a chical
masking ha e been p oposed. Conc e ely, GSM-NH [41]e alua es he
saliency maps a mul iple le els based on he in o ma ion o p e ious
less fine-g ained saliency maps, whe eas BODEM [21] u he ex ends
his idea bu ocuses on an ex eme black-box scena io whe e only ob-
jec coo dina es a e a ailable.
XAI me hods o indus ial applica ions. Al hough XAI is inc easingly
impo an in indus ial se ings o ensu e sa e y, eliabili y and com-
pliance, he adop ion o XAI o objec de ec ion me hods in indus ial
use cases has been limi ed o da e [17,15,9]. The as majo i y o he
wo ks ocus ei he on image classifica ion, like [8] ha u ilizes G ad-
CAM o in e p e ib a ion signal images in he classifica ion o bea ing
aul s; ime-se ies da a, e.g. [35] ha p esen s he implemen a ion and
explana ions o a emaining li e es ima o model; o abula da a, as in
[31]whe e SHAP is used o in e p e and s udy he influence o soil
and clima e ea u es on c op ecommenda ions. Rega ding XAI and ob-
jec de ec ion o indus ial applica ions, we can find a ew exempla y
s udies ha expose he sho age o eal-wo ld use cases cu en ly no ed
in his echnological c oss oads. In [23], a ious objec de ec ion mod-
els a e e alua ed o hei effec i eness in de ec ing weld cha ac e is ics
in adiog aphy images, wi h an emphasis on explainabili y and deploy-
men on edge de ices o assis wo ke s. In he same sense, [32]p o ides
a comp ehensi e e iew and analysis o a ious XAI echniques applied
o objec de ec ion asks in compu e ized omog aphy imaging o med-
ical pu poses. Finally, [14] demons a es how o in eg a e G ad-CAM
in o he YOLO a chi ec u e and pe o ms expe imen s in bo h public
and p i a e da ase s o ehicle on collision and ea - iew came as.
3. Backg ound
We now p oceed by elabo a ing on key concep s needed o p ope ly
unde s and he de ails o he p oposed D-MFPP echnique and he D-
Dele ion me ic ha lie a he co e o his wo k. Conc e ely, we p o ide
undamen als o objec de ec ion models (Sec ion 3.1) and XAI, wi h a
ocus on model-agnos ic black-box me hods o explain he p edic ions
o objec de ec ion models (Sec ion 3.2).
Resul s in Enginee ing 24 (2024) 103498
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A. And es, A. Ma inez-Se as, I. Laña e al.
3.1. Objec de ec o s
Objec de ec o s a e c ucial componen s in compu e ision asks,
capable o iden i ying and localizing objec s wi hin an image. They can
be b oadly ca ego ized in o single-s age and wo-s age de ec o s.
Single-s age de ec o s. They di ec ly p edic bounding boxes and class
p obabili ies om inpu images in a single pass. Popula single-s age
de ec o s, such as YOLO [37], SSD [18]and Re inaNe [30], ea objec
de ec ion as a simple eg ession p oblem, s aigh om image pixels
o bounding box coo dina es and class p obabili ies. To his end, hey
p oduce a dense g id o bounding box p oposals and class p obabili ies
in one s ep. Specifically, YOLO [37] di ides he inpu image in o a g id
and p edic s bounding boxes and class p obabili ies o each g id cell.
Al hough his efficiency is beneficial o eal- ime applica ions, i o en
comes a he cos o accu acy when compa ed o wo-s age de ec o s
Two-s age de ec o s. These models, among which Fas e R-CNN [28]
can be conside ed o be he mos ep esen a i e one, ollow a mo e com-
plex app oach ha di ides he de ec ion p ocess in o wo s ages. In he
fi s s age, a Region P oposal Ne wo k (RPN) gene a es a se o candida e
objec p oposals (bounding boxes) om he inpu image. In he second
s age, hese p oposals a e efined and classified in o diffe en objec ca -
ego ies by a second ne wo k. This second s age ypically in ol es a mo e
complex ne wo k, such as a con olu ional neu al ne wo k (CNN), which
pe o ms classifica ion and u he efinemen o he bounding box co-
o dina es. This wo-s ep p ocess boos s accu acy by allowing o a mo e
efined ea u e analysis, hough i also slows down p ocessing, making
wo-s age de ec o s less sui ed o applica ions ha equi e high-speed
pe o mance.
Mos de ec o ne wo ks, including Fas e R-CNN and YOLO, p o-
duce a la ge numbe o bounding box p oposals which a e subsequen ly
efined using confidence h esholding and Non-Maximum Supp ession
(NMS) o p oduce a se o finally de ec ed objec s in he image. Each
bounding box p oposal 𝑑𝑖can be defined as ollows:
𝐝𝑖=[𝐋𝑖,𝑂
𝑖,𝐏𝑖]=[(𝑥𝑖
1,𝑦
𝑖
1,𝑥
𝑖
2,𝑦
𝑖
2),𝑂
𝑖,(𝑝𝑖
1,…,𝑝
𝑖
𝐶)],(1)
whe e 𝐋𝑖defines he bounding box co ne s (𝑥𝑖
1, 𝑦𝑖
1)and (𝑥𝑖
2, 𝑦𝑖
2); 𝑂𝑖∈
[0, 1] e e s o he p obabili y ha bounding box 𝐿𝑖con ains an objec
o any class; and 𝐏𝑖is a ec o o p obabili ies (𝑝𝑖
1, … , 𝑝𝑖
𝐶) ep esen -
ing he p obabili y ha egion 𝐋𝑖belongs o each o 𝐶classes. Unlike
adi ional classifie s, which assign a single class label o an en i e im-
age, objec de ec o s mus handle bo h classifica ion and localiza ion
simul aneously. This dual ask, p edic ing he class and p ecise loca ion
o each objec , inc eases he complexi y o making hese models in e -
p e able.
3.2. Explainable A ificial In elligence (XAI)
Despi e he g ea pe o mance exhibi ed by objec de ec o s in man-
i old applica ions, hei adop ion in isk-sensi i e scena ios is o en hin-
de ed by a lack o us and anspa ency by he use making decisions
based on he de ec ions issued by hese models. As in oduced p e i-
ously, esea ch on XAI p oduce echniques and me hods ha make he
beha io and p edic ions o AI models unde s andable o humans wi h-
ou sac ificing pe o mance [11]. To his end, mul iple XAI echniques
ha e been p oposed, which can be classified in o ou b oad ca ego ies
[3]:
•Scoop-based echniques ocus on he ex en o he explana ion, p o id-
ing ei he local explana ions o specific p edic ions o global expla-
na ions o he o e all model beha io .
•Complexi y-based me hods conside he complexi y o he model, wi h
simple , in e p e able models offe ing in insic in e p e abili y and
mo e complex models equi ing pos -hoc explana ions.
•Model-based app oaches dis inguish be ween XAI me hods ha a e spe-
cific o pa icula ypes o models, and hose ha a e model-agnos ic,
capable o being applied o any model dis ega ding he specifics o
hei in e nals.
•Me hodology-based echniques a e ca ego ized by hei me hodological
app oach, such as backp opaga ion-based me hods ha ace inpu
influences, o pe u ba ion-based me hods ha al e inpu s o obse e
changes in he ou pu o he model.
Gi en ha objec de ec o s a e ypically complex neu al ne wo ks,
hey all unde he complexi y-based ca ego y, he eby equi ing pos -hoc
explainabili y me hods o explain hei decisions. Among he a ious
me hodology-based echniques, a ibu ion me hods a e commonly used
o es ima e he ele ance o each pixel in an image o he de ec ion
ask. A ibu ion me hods a e pa icula ly impo an o objec de ec-
ion, whe e bo h localiza ion and classifica ion need o be explained.
T adi ional a ibu ion me hods ha e been p ima ily de eloped o
image classifie s [1], which p oduce a single ca ego ical ou pu , making
hem less sui ed o objec de ec o s. Objec de ec o s, unlike classi-
fie s, gene a e mul iple de ec ion ec o s ha encode no only class
p obabili ies, bu also localiza ion in o ma ion and addi ional me ics,
such as objec ness sco es (see Sec ion 3.1). Fu he mo e, echniques
like NMS and confidence h eshold fil e ing, which a e used o efine
bounding box p oposals, add complexi ies ha equi e a deepe un-
de s anding o he model’s in e nal wo kings, complica ing he use o
ce ain XAI me hods, such as g adien -based app oaches. The e o e, we
ocus on model-agnos ic black-box XAI app oaches, which a e designed
o be a chi ec u e-independen , and do no depend a all on he specifics
o he model unde a ge .
Among model-agnos ic XAI me hods, pe u ba ion-based app oaches
a e commonly used due o hei simplici y and effec i eness in e ealing
which pa s o he inpu a e mos influen ial o he model’s p edic ions.
Pe u ba ion-based echniques offe a di ec way o assess how changes
o he inpu image affec he model’s ou pu . By sys ema ically al e ing
o masking pa s o he inpu image (using masks o gene a e pe u bed
samples), hese me hods allow in e ing he impo ance o diffe en e-
gions based on he model’s inpu -ou pu beha io .
The ypical pipeline o pe u ba ion-based XAI me hods can be di-
ided in o h ee s ages: (1) Da a P epa a ion, (2) Model Assessmen ,
and (3) Impo ance Compu a ion. In he Da a P epa a ion s age, masks
a e gene a ed and applied o he image o c ea e pe u bed samples.
The Model Assessmen s age in ol es passing hese pe u bed images
h ough he model o obse e he changes in ou pu . Finally, in he
Impo ance Compu a ion s age, he impo ance o each pixel is calcu-
la ed by compa ing he model’s ou pu s o he o iginal and pe u bed
images. While he Model Assessmen s age emains consis en ac oss
me hods, wi h each pe u bed image passed h ough he model, he Im-
po ance Compu a ion a ies depending on he XAI app oach used. This
can ange om simple echniques like e aining a model (e.g., LIME)
o mo e complex app oaches. Since he effec i eness o hese me hods
la gely depends on how he pe u bed images a e gene a ed, h ee mask
gene a ion algo i hms a e nex desc ibed (Fig. 1):
•Sliding Window: This me hod, which is simila o he Occlusion ech-
nique p oposed in [43], sys ema ically mo es a window o fixed size
ac oss he image and se s he egion wi hin he window o a cons an
alue (e.g., ze o) o occlude ha pa o he image. By i e a i ely slid-
ing he window ac oss he en i e image, we can assess he impac
o each occluded egion on he model’s ou pu . The me hod equi es
speci ying he window size, which de e mines he a ea o he image
being occluded a each s ep, and he s ide, which se s how much he
window mo es be ween i e a ions.
•RISE: Randomized Inpu Sampling o Explana ion (RISE) [25]in-
ol es sampling 𝑁bina y masks o size ℎ ×𝑤, which a e smalle
han he o iginal image size 𝐻×𝑊. Each elemen in he mask
is independen ly se o 1 wi h p obabili y 𝑝and o 0 wi h he
emaining p obabili y 1 −𝑝. These masks a e hen upsampled o
size (ℎ+1)⋅𝐶𝐻×(𝑤+1)⋅𝐶𝑊using bilinea in e pola ion, whe e
Resul s in Enginee ing 24 (2024) 103498
4
A. And es, A. Ma inez-Se as, I. Laña e al.
Fig. 1. Example o h ee masks gene a ed using Sliding Window ( op), RISE
(middle), and MFPP (bo om). MFPP masks a e dependen on he image a he
inpu o he model. In his case, we conside a sample om he ba e y assembly
da ase de ailed in Sec ion 4.
𝐶𝐻×𝐶𝑊=⌊𝐻∕ℎ⌋×⌊𝑊∕𝑤⌋. The upsampled masks a e c opped o
he o iginal image size 𝐻×𝑊wi h uni o mly andom offse s anging
om (0, 0) o (𝐶𝐻, 𝐶𝑊). This me hod c ea es a di e se se o masks
ha co e diffe en pa s o he image, allowing o a comp ehensi e
e alua ion o he impo ance o a ious egions.
•MFPP: The so-called Mo phological F agmen al Pe u ba ion Py amid
(MFPP) [42]me hod di ides he inpu image in o mul i-scale ag-
men s and pe u bs hem andomly. In his sense, i is simila o RISE,
bu ins ead o pe u bing elemen s o he gene a ed masks wi h di-
mension ℎ ×𝑤, MFPP defines egions acco ding o segmen a ions a
diffe en scales. Depending on he numbe o defined agmen s, he
egions would be mo e fine-g ained ye mo e ime-consuming. The
segmen s a e dependen on each image, equi ing he c ea ion o new
masks o e e y image.
4. Ma e ials and me hods
This sec ion desc ibes he indus ial obo ics use cases in wha e e s
o he da ase s (Sec ion 4.1), objec de ec ion model (Sec ion 4.2), XAI
me hods (Sec ion 4.3) and he explana ion quali y me ics (Sec ion 4.4)
conside ed in ou wo k. The no el XAI echnique and quali y me ics
p oposed in his manusc ip a e also desc ibed in Sec ion 4.3.
4.1. Indus ial obo ics da ase s unde conside a ion
The da ase s used in his manusc ip ha e been collec ed du ing he
cou se o he ULTIMATE p ojec , h ps://ul ima e -p ojec .eu/, which
ea u es wo dis inc eal obo ics use cases [16]. The fi s da ase ,
om PIAP h ps://piap .lukasiewicz .go .pl/, in ol es a collabo a i e
wo kspace whe e a human and a obo ic a m wo k oge he . The sec-
ond da ase , p o ided by Robo nik h ps:// obo nik .eu/, ocuses on a
ba e y assembly a ea, whe e a obo ic a m assembles componen s o
a ba e y ki .1
Da ase 1: Human-Robo Da ase . This da ase consis s o 96 images
cap u ed om h ee diffe en came as, as exemplified in Fig. 2, wi h 32
images aken om each came a. The da ase includes wo objec classes:
human and g ippe . Impo an ly, each image in his da ase con ains
1While he da ase s con ain a ela i ely small numbe o images, his da a
sho age is ypically encoun e ed in eal-wo ld indus ial scena ios subjec o
da a a ailabili y cons ain s. Ne e heless, in he use cases unde conside a ions
he con ex ual and scene a iabili y is minimal, yielding sho - ailed dis ibu-
ions o he objec s o be de ec ed. The e o e, he small da ase s desc ibed in he
pape sufficien ly cap u e he ele an ea u es o he specific objec de ec ion
asks add essed by he models.
Fig. 2. Da ase 1 (Human-Robo collabo a ion): Da a a e cap u ed om came as
loca ed in 3 diffe en posi ions. All he images belonging o his da ase con ain
he aces blu o p ese e anonymi y.
Fig. 3. Da ase 2 (Ba e y Assembly ki ): The se up whe e a obo ic a m would
assemble he ki based a bi d-eye iew o he able whe e all componen a e
expec ed o be; (le ) a heo e ical se up; ( igh ) an ac ual sample.
only a single objec o each class, meaning a maximum o one human
and one g ippe pe image. To ensu e a di e se and ep esen a i e
sample, we applied ea u e ex ac ion using ResNe [12] o ob ain em-
beddings o he en i e da ase . The dimensionali y o hese embeddings
was educed using P incipal Componen Analysis (PCA), ollowed by K-
means clus e ing (wi h 𝑘 =8clus e s). F om each clus e , ou images
we e andomly selec ed, esul ing in a final subse . The da a we e spli
in o h ee se s: 72 images o aining (75%), 6 o alida ion (6.25%),
and 18 o es ing (18.75%). To main ain consis ency, we applied he
same pa i ioning o he da a om each came a. This esul ed in 24 im-
ages o aining, 2 o alida ion, and 6 o es ing om each came a.
Da ase 2: Ba e y Assembly Da ase . This da ase consis s o 7 images,
all cap u ed om a bi d’s-eye ( op-down) iew, showing a obo ic a m
assembling a ba e y ki , as shown in Fig. 3. The da ase includes fi e
dis inc objec ypes: indi idual ba e y,bms_a,bms_b,ba -
e y holde , and unknown objec . In con as o he Human-Robo
Da ase , each image in he Ba e y Assembly Da ase may con ain mul-
iple objec s o he same class, such as se e al indi idual ba e ies in a
single scene.
I is wo h no ing ha XAI echniques can be applied o any ype o
da a. When applied o aining da a, hey help e eal wha he model
has lea ned o ocus on du ing aining. When applied o es da a, hey
p o ide insigh in o how well he model gene alizes o new, unseen ex-
amples. Fo he Human-Robo Da ase , XAI explana ions we e applied
exclusi ely o he es images, allowing us o assess he model’s beha -
io on unseen da a. Howe e , o he Ba e y Assembly Da ase , gi en
he limi ed numbe o images (only 7), XAI explana ions we e applied
o he en i e da ase .
4.2. Objec de ec ion model: YOLO 8
Among he possible objec de ec o models, we selec ed one o he
s a e-o - he-a op ions, YOLO 8, due o i s nume ous ad ancemen s
o e p e ious e sions and i s obus pe o mance in objec de ec ion
asks [37]. YOLO 8 [27] in eg a es a no el combina ion o Fea u e Py a-
mid Ne wo k (FPN) and Pa h Agg ega ion Ne wo k (PAN) a chi ec u es,
enhancing i s abili y o de ec objec s a a ious scales and esolu ions.
Resul s in Enginee ing 24 (2024) 103498
5
A. And es, A. Ma inez-Se as, I. Laña e al.
The FPN g adually educes he spa ial esolu ion o he inpu image
while inc easing ea u e channels, acili a ing mul i-scale objec de ec-
ion. The PAN a chi ec u e u he agg ega es ea u es om diffe en
le els h ough skip connec ions, imp o ing he de ec ion o objec s wi h
di e se sizes and shapes. Addi ionally, YOLO 8 in oduces an ancho -
ee de ec ion mechanism ha di ec ly p edic s he cen e o an objec
(ins ead o he offse om a known ancho box), educing he numbe
o box p oposals and speeding-up he pos -p ocessing. Fu he mo e, i
was ained wi h la ge and mo e di e se da ase s including he pop-
ula COCO da ase , imp o ing i s pe o mance ac oss a wide ange o
images.
YOLO 8 was de eloped and eleased by Ul aly ics, and al hough
he model and i s weigh s a e open-sou ce, mos use s a e expec ed o
u ilize he Ul aly ics amewo k o i s enhanced usabili y. Howe e ,
unlike p e ious YOLO eleases whe e he p obabili y o each class pe
p edic ed box was accessible, in YOLO 8, he Ul aly ics API ou pu s
only he p obabili y o he class wi h he highes confidence in each
box.2Consequen ly, by de aul , YOLO 8 ou pu s:
𝐝𝑖=[𝐋𝑖,𝑂
𝑖,𝐶
𝑖]=[(𝑥𝑖
1,𝑦
𝑖
1,𝑥
𝑖
2,𝑦
𝑖
2),𝑂
𝑖,𝐶
𝑖],(2)
whe e 𝐋𝑖=(𝑥𝑖
1, 𝑦𝑖
1, 𝑥𝑖
2, 𝑦𝑖
2) ep esen s he coo dina es o he bounding
box, 𝑂𝑖deno es he objec ness sco e, and 𝐶𝑖co esponds o he p e-
dic ed class label o he objec wi hin he bounding box, which diffe s
wi h espec o he ou pu s shown in Exp ession (1).
4.3. Explainabili y me hods
We e alua e ou popula me hods o gene a ing isual explana-
ions o black-box models: LIME, RISE, D-RISE, and D-MFPP. The fi s
wo me hods, LIME and RISE,3we e o iginally de eloped o image clas-
sifie s bu can be adap ed o objec de ec o s. Howe e , hey p ima ily
ocus on explaining classifica ion aspec s and a e no capable o add ess-
ing localiza ion cha ac e is ics. In con as , D-RISE is one o he fi s XAI
me hods specifically designed o objec de ec o s, p o iding explana-
ions ha encompass bo h classifica ion and localiza ion. Addi ionally,
we ex end he exis ing MFPP me hod (o iginally ailo ed o classifie s)
in o a e sion sui able o objec de ec ion, which we e e o as D-MFPP.
In wha ollows we b iefly desc ibe hem, flowing in o a desc ip ion o
he p oposed D-MFPP app oach:
•LIME was o iginally designed o explain he p edic ions o any clas-
sifie by app oxima ing i locally wi h an in e p e able model. To
explain he p edic ion o an inpu image 𝐼, LIME fi s an in e p e able
model 𝑔(e.g., a linea model) o app oxima e he beha io o he
black-box model 𝑓locally a ound 𝐼. The simila i y be ween he o ig-
inal image and he pe u bed samples is measu ed using a ke nel
unc ion 𝜋𝐼(𝑧). When image explana ions a e a ge ed, LIME g oups
con iguous pixels in o supe pixels based on simila ea u es hey ep-
esen . This app oach allows LIME o measu e he impo ance o
egions in he image a he han indi idual pixels, making he expla-
na ions mo e in e p e able.
•As in oduced in he p e ious sec ion, RISE [25]was o iginally de-
signed o deep neu al ne wo ks ha ake images as inpu and ou -
pu a class p obabili y (e.g., a classifie like ResNe -50). I gene a es
saliency maps ha indica e he impo ance o each pixel by applying
andomly gene a ed bina y masks 𝑀𝑖 o he inpu image 𝐼and obse -
ing he changes in he model’s ou pu 𝑓(𝐼⊙𝑀
𝑖). In RISE, 𝑁bina y
masks 𝑀𝑖∈{0, 1}ℎ×𝑤a e gene a ed (as explained in Sec ion 3.2).
2h ps://gi hub .com /ul aly ics /ul aly ics /issues /2863%
h ps://gi hub .com /ul aly ics /ul aly ics /issues /4908.
3These XAI me hods ha e been chosen due o hei pe u ba ion-based na u e,
which aligns closely wi h he me hodology ollowed by he XAI me hods D-
RISE and D-MFPP p oposed in his wo k. Bo h D-RISE and D-MFPP gene a e
explana ions h ough pe u ba ions.
These masks a e hen applied o he inpu image 𝐼 o gene a e masked
images 𝐼′
𝑖=𝐼⊙𝑀
𝑖, whe e ⊙deno es elemen -wise mul iplica ion.
The model is e alua ed on each masked image 𝐼′
𝑖 o ob ain he ou -
pu s 𝑓(𝐼⊙𝑀
𝑖). The impo ance sco e o each pixel (𝑥, 𝑦)is hen
calcula ed as he weigh ed sum o he ou pu s:
𝑆𝐼,𝑓 (𝑥, 𝑦)= 1
𝑁
𝑁
∑
𝑖=1
𝑓(𝐼⊙𝑀
𝑖)⋅𝑀𝑖(𝑥, 𝑦)(3)
whe e he weigh s 𝑀𝑖(𝑥, 𝑦) ep esen he alue o mask 𝑖a pixel (𝑥, 𝑦).
The in ui ion behind RISE is ha 𝑓(𝐼⊙𝑀
𝑖)would be high when pix-
els p ese ed by mask 𝑀𝑖a e impo an . Al hough his is ue when
ha ing infini e di e se masks, in p ac ice RISE calcula es each pix-
el’s impo ance empi ically by Mon e Ca lo sampling. The e o e, RISE
la gely depends on he numbe o masks (𝑁) and how hey a e gen-
e a ed (i.e., is sensi i e o he selec ed p obabili y 𝑝and esolu ion
𝑠).
4.3.1. D-RISE and p oposed D-MFPP app oach
Unlike he o he wo app oaches o iginally designed o classifie s
ha measu e solely classifica ion aspec s, D-RISE (De ec o Random-
ized Inpu Sampling o Explana ion) [26]was designed o explain bo h
he classifica ion and localiza ion o a de ec ion. In his sense, D-RISE ex-
ends RISE by p oducing saliency maps specifically o objec de ec o s.
As p e iously seen in Sec ion 3.1, he ou pu gi en by an objec de ec-
o diffe s om he p obabili y ec o gi en by a classifie , ob aining
localiza ion in o ma ion 𝐿𝑖, an objec ness sco e 𝑂𝑖and he p obabili y
o classi ying each bounding box o any o he conside ed classes 𝑃𝑖. As
a consequence, Exp ession (3)used by RISE is eplaced in D-RISE wi h
a new simila i y sco e, gi en by:
𝑆𝐼,𝑓 (𝐝𝑡,𝐝𝑗)=𝑠𝐿(𝐝𝑡,𝐝𝑗)⋅𝑠𝑃(𝐝𝑡,𝐝𝑗)⋅𝑠𝑂(𝐝𝑡,𝐝𝑗),(4)
whe e 𝑠𝐿=𝐼𝑜𝑈(𝐋𝑡, 𝐋𝑗), 𝑠𝑃=𝐏𝑡⋅𝐏𝑗∕(||𝐏𝑡|| ⋅||𝐏𝑗||), and 𝑠𝑂=𝑂𝑗. In his
o mula ion, 𝑠𝐿 ep esen s he spa ial p oximi y o he bounding boxes
encoded by he a ge de ec ion 𝐝𝑡and he p oposal 𝐝𝑗, measu ed using
he In e sec ion o e Union (IoU); he e m 𝑠𝑃e alua es he simila i y
be ween he class p obabili ies o he a ge de ec ion and he p oposal
using cosine simila i y; and 𝑠𝑂inco po a es he objec ness sco e o he
p oposal 𝑂𝑗. I is impo an o no e ha o a de ec ion a ge 𝐝𝑡 he e
would po en ially be mo e han one de ec ion p oposals 𝐝𝑗. The e o e,
we would ha e mul iple 𝑆𝐼,𝑓(𝐝𝑡, 𝐝𝑗). As explained in D-RISE, he expla-
na ions conside only he de ec ion wi h maximal sco e o each mask:
𝑆𝐼,𝑓 (𝐝𝑡,𝑓(𝑀𝑖⊙𝐼))=max
𝐝𝑗∈𝑓(𝑀𝑖⊙𝐼)𝑆𝐼,𝑓(𝐝𝑡,𝐝𝑗).(5)
Gi en he YOLO 8 ou pu s explained in Sec ion 4.2, which do no
p o ide he class p obabili y ec o 𝑃𝑖wi hou modi ying i s a chi ec-
u e (an app oach we wan o a oid wi hin he scope o his pape ),
we mus adap he simila i y sco e o only conside 𝑠𝐿and 𝑠𝑂. Conse-
quen ly, he modified simila i y sco e can be exp essed as:
𝑆𝐼,𝑓 (𝐝𝑡,𝐝𝑗)=𝑠𝐿(𝐝𝑡,𝐝𝑗)⋅𝑠𝑂(𝐝𝑡,𝐝𝑗)=𝐼𝑜𝑈(𝐋𝑡,𝐋𝑗)⋅𝑂𝑗.(6)
This adjus men allows s ill u ilizing D-RISE effec i ely o gene -
a ing saliency maps wi h he de aul YOLO 8 model, ocusing on he
spa ial and objec ness aspec s o de ec ions, while main aining he in-
eg i y o he model’s o iginal a chi ec u e.
Simila ly, we can adop his simila i y sco e bu apply i wi h a
diffe en mask gene a ion p ocess. The MFPP me hod in oduced in Sec-
ion 3.2, o iginally designed o classifica ion asks, can be ex ended by
applying Equa ion (6), esul ing in D-MFPP. To he bes o ou knowl-
edge, no p e ious wo k has p oposed his a ian o MFPP o objec
de ec ion asks.
Resul s in Enginee ing 24 (2024) 103498
6
A. And es, A. Ma inez-Se as, I. Laña e al.
4.4. Me ics
E alua ing he pe o mance o a ibu ion-based explainabili y me h-
ods o image da a in ol es assessing how well he gene a ed ele ance
hea maps highligh impo an egions o he inpu image ha con ibu e
o he model’s decision. Gene ally, acco ding o [13], explana ion qual-
i y me ics can be g ouped in o six ca ego ies based on hei logical
simila i y: ai h ulness, obus ness, localiza ion, complexi y, andom-
iza ion, and axioma ic me ics. In his s udy, we ocus on wo o hese
ca ego ies ha a e pa icula ly ele an o objec de ec ion: localiza ion
(Sec ion 4.4.1) and ai h ulness (Sec ion 4.4.2).
4.4.1. Localiza ion
Localiza ion me ics e alua e whe he he explainable e idence is
cen e ed a ound a egion o in e es (RoI) defined by a bounding box,
segmen a ion mask, o a cell wi hin a g id. These me ics aim o e i y i
he saliency maps co ec ly highligh he a eas in he image ha con ain
he objec o in e es . Among hem, ou expe imen s will conside :
•Poin ing Game (PG), which is a human e alua ion me ic in oduced
in [44]. I he highes saliency poin lies inside he human-anno a ed
bounding box o an objec , i is coun ed as a hi . The PG accu acy is
gi en by:
PG =#𝐻𝑖𝑡𝑠
#𝐻𝑖𝑡𝑠+#𝑀𝑖𝑠𝑠𝑒𝑠 ,(7)
which is a e aged o e all ca ego ies in he da ase .
•Ene gy-based Poin ing Game (EBPG) [39], which measu es he p opo -
ion o ac i a ions wi hin he gi en bounding box ela i e o he whole
ac i a ion in he image. I assesses how much o he model’s ac i a-
ion ene gy is concen a ed wi hin he p edefined egion o in e es .
Fo mally:
EBPG =∑(𝑥,𝑦)∈bbox 𝑆𝐼,𝑓 (𝑥, 𝑦)
∑(𝑥,𝑦)∈bbox 𝑆𝐼,𝑓 (𝑥, 𝑦)+∑(𝑥,𝑦)∉bbox 𝑆𝐼,𝑓(𝑥, 𝑦),(8)
whe e 𝑆𝐼,𝑓 (𝑥, 𝑦) ep esen he saliency sco e a pixel
(𝑥, 𝑦), ∑(𝑥,𝑦)∈bbox 𝑆𝐼,𝑓 (𝑥, 𝑦) ep esen s he sum o ac i a ion alues
wi hin he bounding box, and
∑(𝑥,𝑦)∉bbox 𝑆𝐼,𝑓(𝑥, 𝑦) ep esen s he sum
o ac i a ion alues ou side he bounding box.
4.4.2. Fai h ulness
Me ics accoun ing o ai h ulness quan i y o wha ex en explana-
ions ollow he p edic i e beha io o he model, asse ing ha mo e
impo an ea u es play a la ge ole in model ou comes. These me ics
ocus on unde s anding he causal ela ionship be ween inpu ea u es
and he model’s ou pu by sys ema ically al e ing he ea u es and ob-
se ing he changes in p edic ions. Among hem:
•Dele ion: Inspi ed by he wo k by [4], he Dele ion me ic was p o-
posed in RISE [25]. This me ic measu es a dec ease in he p obabili y
o he p edic ed class as mo e and mo e impo an pixels a e emo ed,
whe e he impo ance is ob ained om he saliency map. A sha p
d op, and hus a low A ea Unde he p obabili y Cu e (AUC, as a
unc ion o he ac ion o emo ed pixels), indica es a good explana-
ion. Gi en he impo ance sco e o each pixel calcula ed by any XAI
me hod, 𝑆𝐼,𝑓, we can o mula e he Dele ion me ic as:
Dele ion(I,S,c) =AUC({𝑃𝑟(𝑓(𝐼⊙𝑀
𝑘)=𝑐)}𝐾
𝑘=1),(9)
whe e 𝐼is he o iginal image, 𝑀𝑘 ep esen a mask wi h he 𝑘- h
mos impo an pixels emo ed so ed by 𝑆𝐼,𝑓 , 𝑃𝑟(𝑓(𝐼⊙𝑀
𝑘)=𝑐)
ep esen s he p obabili y o model 𝑓p edic ing ha he bounding
box belongs o class 𝑐, and AUC(⋅) compu es he a ea unde he cu e
o he 𝐾p edic ions.
•Minimum Subse : I ollows he same logic as Dele ion, bu ins ead o
de e mining he AUC, i conside s he equi ed numbe o pixels ha
make he p edic ion o change [10]. Gi en he impo ance sco e o
each pixel (𝑆𝐼,𝑓 ), Min-Subse is defined as he smalles subse o pixels
ha needs o be emo ed o change he model’s p edic ion. Ma hema -
ically:
Min-Subse (𝐼,𝑆,𝑐)=
min {𝑘∈{1,2…,𝐾}∶ 𝑓(𝐼⊙𝑀
𝑘)≠𝑓(𝐼)},(10)
whe e 𝑓(𝐼⊙𝑀
𝑘) ep esen s he class label assigned by he model 𝑓
a e passing he image 𝐼wi h he op 𝑘mos impo an pixels e-
mo ed, and 𝑓(𝐼)is he class label p edic ed o he o iginal image.
4.4.3. P oposed D-dele ion and D-minimal subse me ics
O iginally, Dele ion was designed o classifie s. Howe e , wi h ob-
jec de ec o s, mul iple de ec ions in a single image can occu . Al hough
D-RISE s a ed he necessi y o adap his me ic o objec de ec o s [26],
no o mal defini ion can be ound in he li e a u e. The e o e, conside -
ing he impo ance o his issue in eal use cases, we o mally e-define
Equa ion (9)in wo manne s:
1. Dele ion. Measu es he explana ion gi en he a ge class label 𝐶𝑡( e-
ga dless i he e is mo e han one elemen o a class) and i e a i ely
emo es he op 𝑘mos impo an pixels:
Dele ion(𝐼,𝑆,𝐶𝑡)=
𝐴𝑈𝐶 ⎛⎜⎜⎝{max
𝐝𝑘
𝑗[𝑂𝑘
𝑗
⋅I{𝐶𝑘
𝑗=𝐶𝑡}]}𝐾
𝑘=1⎞⎟⎟⎠
.(11)
The model 𝑓(⋅) akes as inpu he masked image 𝐼⊙𝑀
𝑘and ou -
pu s a se o bounding box p oposals 𝐝𝑘
𝑗=[𝐋𝑘
𝑗, 𝑂𝑘
𝑗, 𝐶𝑘
𝑗]. The indica o
unc ion I{𝐶𝑘
𝑗=𝐶𝑡}equals 1 i he p edic ed class 𝐶𝑘
𝑗ma ches he
a ge class 𝐶𝑡, and 0 o he wise. The e m max𝐝𝑘
𝑗[𝑂𝑘
𝑗
⋅I{𝐶𝑘
𝑗=𝐶𝑡}]
selec s he maximum objec ness sco e 𝑂𝑘
𝑗 o he bounding boxes
whe e he p edic ed class ma ches he a ge class. The AUC is hen
compu ed o e he se o p edic ion sco es o he 𝐾s eps, whe e a
each s ep he mos impo an pixels a e p og essi ely emo ed.
2. D-Dele ion. While he s anda d Dele ion me ic e alua es he impac
o pixel emo al on a class p edic ion, i lacks he abili y o accoun
o spa ial localiza ion, which is essen ial in objec de ec ion asks
whe e mul iple ins ances o he same class can appea . D-Dele ion
add esses his limi a ion by ocusing on a specific a ge bounding
box 𝐝𝑡, conside ing bo h he class in o ma ion, 𝐶𝑡, and IoU be ween
he a ge and o he de ec ed p oposals, 𝐝𝑘
𝑗. This ensu es ha he
me ic no only measu es ai h ulness bu also akes localiza ion in o
accoun , p o iding mo e p ecise explana ions in si ua ions whe e di -
e en objec s o he same class coexis . Ma hema ically is exp essed
as:
D-Dele ion(𝐼,𝑆,𝐶𝑡)=
𝐴𝑈𝐶 ⎛⎜⎜⎝{max
𝐝𝑘
𝑗[𝑂𝑘
𝑗
⋅I{𝐶𝑘
𝑗=𝐶𝑡}⋅I{𝐼𝑜𝑈(𝐝𝑡,𝐝𝑘
𝑗)>𝛾}]}𝐾
𝑘=1⎞⎟⎟⎠
(12)
whe e 𝛾is a h eshold. As a consequence, when mul iple elemen s
o he same class a e in an image, D-Dele ion will only conside hose
p oposals 𝐝𝑘
𝑗p edic ed by he model ha ha e a p edefined IoU wi h
he a ge bounding box 𝐝𝑡.
The diffe ence be ween Dele ion and D-Dele ion is illus a ed in
Fig. 4. This figu e highligh s how D-Dele ion dis inguishes be ween
diffe en objec s o he same class by inco po a ing localiza ion in o -
ma ion, leading o mo e efined and accu a e explana ions (↓AUC in
he Figu e’s las ow) when mul iple objec s o he same class a e de-
ec ed in an image. Fo he sake o cla i y, we p o ide he pseudocode
o Dele ion in Algo i hm 1, whe e he main diffe ence wi h espec o
D-Dele ion a e lines 10 o 12.
Resul s in Enginee ing 24 (2024) 103498
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A. And es, A. Ma inez-Se as, I. Laña e al.
Fig. 4. Illus a ion o a collabo a i e wo kspace ea u ing wo humans and a
obo ic a m. The fi s ow shows he o iginal image. The second ow displays
he image wi h he 10% mos impo an pixels emo ed o each human, as
iden ified by an XAI me hod. In he hi d ow, he Dele ion me ic cu e, which
only conside s class ype, shows a high p obabili y sco e e en when he p ima y
human is la gely occluded by he o he pe son. The ou h ow p esen s he D-
Dele ion me ic cu e, which inco po a es a localiza ion componen , p o iding a
mo e accu a e measu e o explana ion impo ance by conside ing he posi ions
o en i ies wi hin he image. A lowe a ea unde he cu e indica es a be e
explana ion.
Las ly, akin o how Min-Subse is ela ed o Dele ion, D-Min-Subse is
associa ed wi h D-Dele ion. Consequen ly, D-Min-Subse conside s bo h
he class ype and he IoU o de e mine he numbe o pixels equi ed
o make he p edic ion o change:
D-Min-Subse (𝐼,𝑆,𝐶𝑡)=
Algo i hm 1 Dele ion Me ic’s Pseudocode o Objec De ec o .
Requi e: Image 𝐼, saliency map 𝑆𝐼,𝑓 , numbe o s eps 𝐾, a ge de ec ion 𝐝𝑡,
a ge class 𝐶𝑡
1: Ini ialize 𝑆←[]
2: o 𝑘 =1 o 𝐾do
3: 𝑀𝑘←𝑆𝐼,𝑓 emo ing he op 𝑘mos impo an pixels
4: Apply mask 𝑀𝑘 o image 𝐼
5: Fo wa d pass h ough he model 𝑓and ob ain he bounding box p opos-
als 𝐝𝑗=[𝐋𝑗, 𝑂𝑗, 𝐶𝑗] =𝑓(𝐼⊙𝑀
𝑘)
6: Ini ialize lis o p oposals: p oposals ←[]
7: o each bounding box 𝐝𝑗p edic ed by he model 𝑓do
8: i 𝐶𝑗=𝐶𝑡 hen
9: p oposals.append(𝑂𝑗)
% Fo D-Dele ion
10: i 𝐼𝑜𝑈(𝐝𝑡, 𝐝𝑗) >𝛾 hen
11: p oposals.append(𝑂𝑗)
12: end i
13: else
14: p oposals.append(0)
15: end i
16: end o
17: Inse he maximum sco e wi hin he dele ion buffe : 𝑆←𝑆∪
max(p oposals)
18: end o
19: Calcula e he Dele ion me ic as he a ea unde he cu e: 𝐷=AUC(𝑆)
20: e u n Dele ion sco e 𝐷
min {𝑘∈{1,2…,𝐾}∶ 𝐶𝑘
𝑗≠𝐶𝑡o 𝐼𝑜𝑈(𝐝𝑡,𝐝𝑘
𝑗)<𝛾},(13)
whe e 𝐶𝑘
𝑗 ep esen s he p edic ed class label o de ec ion 𝑗when pass-
ing he masked image 𝐼⊙𝑀
𝑘 h ough he model 𝑓, wi h 𝐝𝑘
𝑗=𝑓(𝐼⊙𝑀
𝑘)
being he se o de ec ions a e emo ing he op 𝑘mos impo an pix-
els. In his con ex , D-Min-Subse depends on wo condi ions: (1) he class
p obabili y labels 𝐶𝑘
𝑗 o he p edic ed bounding box 𝐝𝑘
𝑗mus no longe
ma ch he a ge class 𝐶𝑡, o (2) he IoU be ween he a ge bounding
box 𝐝𝑡and he p edic ed bounding box 𝐝𝑘
𝑗 alls below he h eshold 𝛾.
The minimum 𝑘is iden ified as he s ep whe e ei he o hese condi ions
is fi s me .
5. Expe imen s and esul s
Con a ily o mos s udies in he XAI li e a u e ha p ima ily o-
cus on benchma k da ase s, ou esea ch wo k ocuses on assessing he
explainabili y o objec de ec o s in eal-wo ld indus ial da a. In his
con ex , o e alua e he effec i eness o explana ions, we o mula e ou
key esea ch ques ions o answe hem wi h empi ical e idence:
•RQ1: Which XAI me hod p o ides he mos eliable and insigh ul
explana ions o objec de ec ion models?
•RQ2: Does he D-Dele ion me ic enhance he us wo hiness o XAI
ou pu s when mul iple objec s o he same class a e p esen in he
image?
•RQ3: How does he mask gene a ion p ocess influence he quali y
o explana ions, pa icula ly when using simila i y sco es o objec
de ec ion? How does D-MFPP beha e?
•RQ4: Do diffe en image dimensions impac he explana ions gene -
a ed by XAI me hods? Do models o a ying sizes (la ge, medium,
small, nano) ocus on diffe en egions o he image in hei explana-
ions?
Nex , we ou line he hype pa ame e s used ac oss ou expe imen s o
ensu e consis ency in aining and e alua ion. Fo bo h da ase s, models
we e ained using he YOLO 8 a chi ec u e o a o al o 100 epochs.
The image size (imgsize) was se o he la ges dimension o he inpu
image (e.g., 720 × 1280 ←←→ 1280), and da a augmen a ion echniques such
as andom ho izon al flipping and colo ji e we e applied. Fo consis-
ency, he de aul Ul aly ics se ings we e used whe e e applicable. In
Resul s in Enginee ing 24 (2024) 103498
8
A. And es, A. Ma inez-Se as, I. Laña e al.
Table 1
Quan i a i e me ics o LIME, RISE and D-RISE o he Human-Robo da ase . The able p esen s he pe o mance
o each XAI echnique in e ms o classifica ion (Dele ion, D-Dele ion, Min-Subse , D-Min-Subse ) and localiza ion
me ics (PG and EBPG), wi h sco es epo ed o each class (Human,G ippe ) and he o e all a e age. Lowe
alues a e be e o me ics ma ked wi h ↓, while highe alues a e be e o hose ma ked wi h ↑.Bold alues
indica e he bes a e age sco es ac oss all objec s, highligh ing he bes -pe o ming XAI me hod o each me ic.
Values highligh ed in g ay ep esen he bes sco es o each objec ca ego y (Human o G ippe ) and should be
in e p e ed e ically.
XAI Me hod Objec Dele ion (↓) D-Dele ion (↓)Min-Subse (↓) D-Min-Subse (↓)PG(↑)EBPG(↑)
LIME
Human 0.0759 0.0632 4.2703 4.2703 1.0000 34.984
G ippe 0.4688 0.0324 1.3859 1.3859 1.0000 2.2270
A e age 0.2723 0.0478 2.8281 2.8281 1.0000 18.6060
RISE
Human 0.1827 0.1241 9.0108 9.0108 0.7500 19.0824
G ippe 0.2637 0.0060 0.6355 0.63 1.0000 1.0542
A e age 0.2232 0.0651 4.8232 4.8232 0.875 10.0683
D-RISE
Human 0.1255 0.0818 5.7335 5.7335 0.8750 20.4061
G ippe 0.2777 0.0059 0.6091 0.6091 1.0000 1.0815
A e age 0.2016 0.0438 3.1713 3.1713 0.9375 10.7438
Fig. 5. Hea maps ob ained by applying RISE (le ) and D-RISE ( igh ) o he
de ec ion o a human in he Human-Robo Da ase .
he case o LIME, we use he baseline implemen a ion o [29], whe e
we adop he SLIC segmen a ion algo i hm [2](wi h 100 segmen s) and
gene a ed 1000 samples o assess he quali y o he p oduced explana-
ions. Fo RISE and D-RISE, we employed 5000 masks wi h a p obabili y
o 0.25 and a esolu ion o 16 ×16 o p oduce he saliency maps. Las ly,
o all objec de ec ion p edic ions, a confidence h eshold o 0.7 was
se o de e mine he alidi y o each de ec ion.
In wha ollows we p esen and discuss on he esul s ob ained o
answe each o he RQ o mula ed abo e:
RQ1: Compa ison be ween XAI me hods
In he Human-Robo da ase , he compa ison be ween LIME, RISE,
and D-RISE, as shown in Table 1, e eals dis inc s eng hs ac oss di -
e en me ics (Sec ion 4.4). LIME pe o ms good in e ms o localiza-
ion, wi h highe PG and EBPG sco es (100% and 18.60%, espec i ely)
compa ed o D-RISE (93.75% and 10.74%). This indica es ha LIME
gene a es mo e localized saliency maps, ocusing closely on he bound-
ing boxes o de ec ed objec s. Howe e , his supe io pe o mance is
pa ly due o he size o he objec being analyzed. LIME’s supe pixel
gene a ion is be e sui ed o la ge objec s (e.g., human), as la ge e-
gions o he image can be g ouped effec i ely in o meaning ul segmen s,
leading o highe localiza ion sco es. This ad an age also applies o clas-
sifica ion, whe e la ge objec s allow LIME o be e p ese e ele an
ea u es o de ec ion. Con e sely, o smalle objec s (e.g., g ippe ),
LIME s uggles when compa ed o he o he me hods, as eflec ed by i s
wo se pe o mance me ics in hose cases.
In con as , RISE and D-RISE a e less sensi i e o objec size, making
hem mo e obus ac oss diffe en objec scales, which is e iden in hei
be e pe o mance on smalle objec s like he g ippe . They achie e
Dele ion sco es o 0.2636 and 0.2777, espec i ely, compa ed o LIME’s
0.4688. When conside ing he o e all pe o mance ac oss classes, RISE,
wi h a Dele ion sco e o 0.2232 and D-Dele ion o 0.0651, shows im-
p o emen o e LIME in classifica ion- ela ed asks bu s ill lags behind
D-RISE, which achie es he lowes Dele ion (0.2016) and D-Dele ion
(0.0438) sco es. Al hough D-RISE offe s he bes balance be ween clas-
sifica ion and localiza ion, he diffe ence be ween RISE and D-RISE is
Fig. 6. Explana ions o a scene using diffe en s ide and window size configu a-
ions when using D-Sliding Window (combina ion o mask gene a ion explained
in Sec ion 3.2 and Equa ion (6)). (Le ) S ide o 16; (Righ ) S ide o 8; (Top)
Window size o 32; (Bo om) Window size o 64.
minimal in his da ase , whe e each image con ains only a single objec
pe class. As a esul , as shown in Fig. 5, hei hea maps a e e y simi-
la o each o he , bo h highligh ing he human head. Howe e , D-RISE
elimina es less ele an a eas mo e effec i ely.
In he esul s ob ained o e he Ba e y Assembly da ase (Table 2),
a simila pa e n can be no iced. LIME excels a localiza ion wi h an
a e age EBPG o 16.03%, while RISE and D-RISE pe o m be e in e-
aining key classifica ion ea u es. Since his da ase includes mul iple
objec s o he same class (e.g., mul iple ba e ies), bo h LIME and RISE,
which a e no designed o handle mul iple de ec ions o he same class,
expose se e e limi a ions. RISE, wi h a D-Dele ion sco e o 0.1474, p e-
se es key ea u es be e han LIME, bu is ou pe o med by D-RISE,
which achie es a sco e o 0.0344. D-RISE also shows he highes PG
sco e (97%), pe o ming significan ly be e han LIME (76.85%) and
RISE (66.95%).
O e all, when dealing wi h da ase s con aining only one objec pe
class, he diffe ences be ween LIME, RISE, and D-RISE a e ela i ely
small in quan i a i e e ms. Howe e , when mul iple objec s o he
same class appea in a gi en inpu image, D-RISE clea ly domina es
o e he es o echniques. As illus a ed in Fig. 7, D-RISE gene a es
cohe en hea maps o each de ec ed objec in he Ba e y Assembly
da ase , whe eas LIME and RISE p o ide a global saliency map o he
en i e class. By combining he indi idual saliency maps om D-RISE,
a mo e accu a e and objec -specific explana ion can be p oduced. This
also highligh s he limi a ions o LIME and RISE when applied o mul-
Resul s in Enginee ing 24 (2024) 103498
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A. And es, A. Ma inez-Se as, I. Laña e al.
Table 2
Quan i a i e me ics o LIME, RISE and D-RISE o he Ba e y Assembly da ase . The able p esen s he pe o mance o each
XAI echnique in e ms o classifica ion (Dele ion, D-Dele ion, Min-Subse , D-Min-Subse ) and localiza ion me ics (PG and
EBPG), wi h sco es epo ed o each objec (indi ba , bms a, bms b, unknown objec , ba holde ) and
he o e all a e age. Lowe alues a e be e o me ics ma ked wi h ↓, while highe alues a e be e o hose ma ked
wi h ↑.Bold alues indica e he bes a e age sco es ac oss all objec s, highligh ing he bes -pe o ming XAI me hod o
each me ic. G ay-highligh ed alues ep esen he bes sco es o each objec ca ego y (indi ba , bms a, bms b,
unknown objec o ba holde ) and should be in e p e ed e ically.
XAI Me hod Objec Dele ion (↓) D-Dele ion (↓)Min-Subse (↓) D-Min-Subse (↓)PG(↑)EBPG(↑)
LIME
indi ba 0.7549 0.2806 44.3412 14.6756 0.3188 2.5347
bms a 0.0184 0.0181 0.8784 0.8784 1.0000 30.7573
bms b 0.0125 0.0125 0.8321 0.8321 1.0000 16.5440
unknown objec 0.0624 0.0245 2.0342 2.0342 1.0000 20.1071
ba holde 0.1498 0.0849 6.8115 4.3766 0.5238 10.2087
A e age 0.1996 0.0841 10.9795 4.5594 0.7685 16.0304
RISE
indi ba 0.7659 0.4359 81.2344 32.0482 0.0144 1.2558
bms a 0.0190 0.0190 1.9417 1.9417 1.0000 3.0409
bms b 0.0217 0.0217 2.1266 2.1266 1.0000 2.4561
unknown objec 0.5333 0.2008 3.8372 3.8372 1.0000 5.5780
ba holde 0.0902 0.0595 7.9519 5.5632 0.3333 3.3681
A e age 0.2860 0.1474 19.4184 9.1034 0.6695 3.1398
D-RISE
indi ba 0.6214 0.0311 35.7678 2.7725 1.0000 2.0546
bms a 0.0181 0.0181 1.9880 1.9880 1.0000 3.2955
bms b 0.0128 0.0116 1.3407 1.3407 1.0000 2.8876
unknown objec 0.0879 0.0485 3.7448 4.2071 0.8571 7.6831
ba holde 0.4839 0.0626 21.7291 5.1009 1.0000 4.9635
A e age 0.2448 0.0344 12.9141 3.0819 0.9714 4.1768
iple objec s, as hei global saliency maps do no diffe en ia e be ween
indi idual ins ances.
RQ2: D-dele ion me ic o scenes wi h mul iple objec s o he same class
As a seconda y obse a ion in he expe imen s o RQ1, he D-
Dele ion me ic is specifically designed o o e come he limi a ions o
adi ional dele ion me ics, pa icula ly when mul iple objec s o he
same class a e p esen in an image.
In he Ba e y Assembly da ase , whe e se e al ins ances o he same
class (e.g., indi ba ) appea , D-Dele ion demons a es clea ad an-
ages. By inspec ing Table 2, RISE, while pe o ming easonably well
wi h an a e age Dele ion sco e o 0.2860, i s ill ob ains a ela i ely
high D-Dele ion sco e o 0.1474, sugges ing ha i s uggles o di -
e en ia e be ween he con ibu ions o indi idual objec s. In con as ,
D-RISE, which ob ains an a e age Dele ion sco e o 0.2448, ou pe o ms
RISE wi h a D-Dele ion sco e o 0.03444. This highligh s D-RISE’s abil-
i y o isola e and p ese e key ea u es o each objec , p o iding mo e
us wo hy, objec -specific explana ions a he han b oad, class-le el
insigh s.
The Min-Subse and D-Min-Subse me ics, which measu e he min-
imal p opo ion o pixels needed o dis up a de ec ion, ein o ce hese
findings. In he Human-Robo da ase , Table 1, whe e only one ob-
jec pe class appea s, he diffe ences be ween Dele ion and D-Dele ion
sco es a e mino , and he Min- Subse and D-Min-Subse alues a e
close o each o he . Howe e , in he Ba e y Assembly da ase , whe e
he diffe ences be ween Dele ion and D-Dele ion a e mo e subs an ial
and mul iple objec s o he same class co-occu in he same image, he
Min-Subse (12.9141) and D-Min-Subse (3.0819) alues also di e ge sig-
nifican ly.
RQ3: Influence o he mask gene a ion s a egy
When compa ing XAI app oaches o objec de ec ion asks config-
u ed wi h diffe en mask gene a ion echniques, he esul s in Tables 3
and 4ini ially sugges ha D-Sliding Window pe o ms he bes in al-
mos all me ics. Howe e , as no ed in he cap ions, his is only in cases
whe e explana ions we e p o ided. Fo he Human-Robo da ase (Ta-
ble 3), ega dless o he window size and s ide, D-Sliding Window ailed
o p o ide explana ions o la ge objec s, such as humans, and only
p o ided meaning ul explana ions o smalle objec s like g ippe in-
s ances. Simila ly, in he Ba e y Assembly da ase (Table 4), D-Sliding
Window s uggled wi h la ge objec s when using a smalle window size
(w=32), which led o highe sco es in classifica ion me ics. E en wi h
Fig. 7. Hea maps gene a ed in a scene o he Ba e y Assembly da ase o wo a ge classes: indi idual ba e y ( op ow) and ba e y holde (bo om
ow). The fi s and second columns shows he saliency maps ob ained using LIME and RISE, independen o he numbe o objec s o he same class in he image.
Columns 3,4 and 5 display hea maps gene a ed using D-RISE o h ee diffe en indi idual elemen s o he same class.