Visible-Light Photo-Iniferter Polymerization of Molecularly Imprinted Polymers for Direct Integration with Nanotransducers - Supporting Information

1 Supporting Information Visible-light photo-iniferter polymerization of molecularly imprinted polymers for direct integration with nanotrasducers Tiziano Di Giulio1, Ibrar Muhammad Asif1, Martina Corsi2, Giuseppe Egidio De Benedetto3 Cosimino Malitesta1, Karsten Haupt4,5, Giuseppe Barillaro2,*, Carlo Gonzato4,*, Elisabetta Mazzotta1,* 1Laboratory of Analytical Chemistry, Department of Biological and Environmental Sciences and Technologies (Di.S.Te.B.A.), University of Salento, via Monteroni, 73100 Lecce (Italy) 2Information Engineering Department, University of Pisa, via G. Caruso 16, 56122 Pisa (Italy) 3Laboratory of Analytical Mass Spectrometry, Cultural Heritage Department, University of Salento, Via Monteroni, 73100 Lecce (Italy) 4CNRS Enzyme and Cell Engineering Laboratory, Université de Technologie de Compiègne, Rue du Docteur Schweitzer, CS 60319, Compiègne 60203 (France) 5Institut Universitaire de France giusepp[email protected]; [email protected]; [email protected]. 2 Figure S1. a) Schematic of the setup used for reflectance measurements, featuring a halogen lamp as the light source and a UV-Vis spectrometer. b) Illustrative graph of reflectance spectra used to calculate EOT values, which serve as a parameter for the functionalization steps and for monitoring binding and removal events in the MIP sensor. Created in https://BioRender.com 3 Figure S2. Optical characterization of PSiO2 scaffold during photo-iniferter polymerization for polymer deposition. Reflectance spectra recorded in air on a PSiO2 scaffold before and after each functionalization step up to the polymer deposition. 4 Figure S3. X-ray photoelectron spectroscopy characterization of PSiO2 scaffolds upon photo-iniferter polymerization. Survey scan recorded on a) bare PSiO2 scaffold; b) after APTES silanization; c) after CDTPA grafting and d) after the polymer deposition (5 hours polymerization). 5 Figure S4. X-ray photoelectron spectroscopy characterization of PSiO2 silanized with APTES. N1s (a) and C 1s (b) signals recorded after PSiO2 silanization with APTES. 6 Figure S5. Relative atomic ratio calculated from XPS data. N/Si (a) and C/Si (b) ratio calculated for each functionalization step of PSiO2 samples for poly(MAA-co-EGDMA) deposition. 7 Figure S6. Contact angle measurements on Si wafer slides. a) contact angle recorded during the functionalized steps up to the polymer deposition. b) average contact angle values recorded for each functionalization step and after photo-iniferter polymerizations performed at different times (n=3). Data are presented as mean (± s.d). 8 Figure S7. Optical characterization of PSiO2 scaffold after polymer deposition for different polymerization times. Reflectance spectra recorded in air on a PSiO2 scaffold before and after photo-iniferter polymerization for different times. 10 15 20 25 30 35 400 500 600 700 800 900 Reflectance (%) Wavelength (nm) CDTPA 3hs 4 hs 5 hs 8 hs 9 Figure S8. X-ray photoelectron spectroscopy characterization of the polymer obtained by photo-iniferter polymerization. High-resolution C1s signal recorded after polymerization of poly(MAA-co-EDGMA) on PSiO2 (a) and in solution as a bulk polymer (b).