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Analysis of leakage in multilayered microstrip lines using complex images

Bernal Méndez, Joaquín; Mesa Ledesma, Francisco Luis; Medina Mena, Francisco

Abstract

The Mixed Potential Integral Equation (MPIE) is combined with the complex image method to analyze the complete spectrum of multilayered printed transmission lines. A relevant contribution of this method is its ability to study both the bound and leaky regimes in a very simple and efficient way. Since the analysis is carried out in the spatial domain, this work also makes it possible to analyze the leakage phenomenon for structures with nonzero thickness conductors.

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Analysis o leakage in mul ilaye ed mic os ip lines using complex images J. Be nal, E Mesa , F. Medina GN~O de Mic oondas. Dep . Elec mica y Elec omagne ismo Facul ad de Fsica A da. Reina Me cedes s/n, 41012 Se illa (SPAIN) Fax: + 34 5 4239434 email: [email p o ec ed] Abs ac The Mixed Po en ial In eg al Equa ion (MPIE) is combined wi h he complcx iinagc me hod Lo analyze he comple e spec um o mul ilaye ed p in ed ansmission lines. A ele an con ibu- ion o his me hod IS i s abili y o s udy bo h he bound and leaky egimes in a e y simple and e icien way. Since he analysis is ca ied ou in he spa ial domain, his wo k also makes i possible o analyze he leakage phenomenon o s uc u es wi h nonze o hickness conduc o s. 1 In oduc ion The p opaga ion cha ac e is ics o guiding s uc u es in laye ed media a e e y e i- cien ly compu ed by means o in eg al equa ion me hods. Fo he laye ed geome y, he equi ed G een’s unc ions a e only known in closed- o m in he spec al domain. I a spa ial domain o mula ion we e used, he spa ial-domain G een’s unc ions can be ob ained om hei spec al e sions h ough Fou ie ans o m in e sion [I]. S ic ly ze o- hickness p in ed ansmission lines can be sol ed bo h in he spec al and he spa- ial domains wi h a he low compu a ional e o . Non-plana conduc o s a e be e ac- coun ed o by means o he spa ial-domain e sion o he in eg al equa ion [Z]. Du ing he las decade, a powe ul ool - he Disc e e Complex Images Technique (DCIT- was de eloped o ob ain he spa ial G een’s unc ions o laye ed s uc u es [3]. This echnique has been p edominan ly applied o 3D plana ci cui s and an ennas p oblems. Recen ly his me hod has been adap ed o deal wi h 2D guiding p oblems, whe e he ele ance o a as gene a ion o he G een’s unc ions is e en mo e signi ican han in he 3D con ex . Thus, plana s ip-like [4] and slo -like [5] s uc u es ha e been sol ed ollowing ha p ocedu e. Howe e , he impo an ques ion posed by he exis ence o bo h su ace and space leaky-wa e solu ions has no been conside ed in hose wo ks whe e only bound modes we e ea ed. Leaky-wa es ha e been comp ehensi ely s ud- ied in he ame o he Spec al Domain Analysis (SDA) [6]. Wo king in SDA implies o pe o m nume ical in eg a ion along a p ope ly chosen pa h in he spec al a iable complex plane. Va ious physical and ma hema ical a gumen s ha e been employed o de e mine he ea u es o his pa h. In his pape we will show how o adap he me hod in [4] o include he leaky egime. This new app oach has he ad an age o being e y simple and e icien and he capabili y o dealing wi h non-plana conduc ing s uc u es. 0-7803-7070-8/0 1 /$lO.OO 0200 1 IEEE 580 Au ho ized licensed use limi ed o: Uni e sidad de Se illa. Downloaded on July 09,2020 a 14:11:05 UTC om IEEE Xplo e. Res ic ions apply. 2 Analysis The p oblem o he de e mina ion o he p opaga ion cons an s o a mul is ip sys em embedded in a laye ed subs a e can be posed in e ms o a Mixed Po en ial In eg al Equa ion iis shown in [4]. The G een' unc ions o he scala and ec o po en ials, Ji"' and K,; , inus be ob ained oin hei spec al e bions. This Implies o pe o m Fou ie ~iiis o m in e sions o he ype: whe e A,J = m, A., b ing lie ans e w wa enuinbe and I;: = siiined p opaga ion cons an . - j.u he as- The DClT can be ad an ageously uaed in his p oble n o a oid he edious nume - iciil in eg a ion in ol ed in (I ). The unde lying idea ia o expand he spec al unc ion ii i a sum o complex exponen ial unc ions whose spa ial-domain coun e pa is known hanks o a 2D Som nc eld iden i y [4]. Howe e , his echnique was only applied o cha x e ize bound modes. Nex we will explain he guidelines o he me hod along wi h lie modi ica ions ha mus be in oduced o gene alize he app oach o accoun o leaky modes. - I is el1 known ha he spec al unc ions G(b:,) show wo ypes o singula i ies: b anch poin a a b., = and poles. They a e espec i ely ela ed o he adia- i~oii iii o i e space and o he inodcs o he backg ound wa eguide. Since he complex im,igcs cxlmision ciiii only i analy ical unc ions, he abo e singula i ies mus be p op- e ly haiidled. This IS done by i s in oducing a change o a iable (ILO = m) ha elimina es b anch poin s and second ex ac ing ou in analy ical o m he signi - icm polcs (in p x ice, hobe poles associa ed wi h abo e cu o wa eguide modes). . a ic con ibu ion IS also explici ly ex ac ed ou . Thus, he spec al domain G een' 'unc lons a e spli in o h ee con ibu ions: - -- whe e G,, ih he quasi-s a ic c in (Go = Ii~iia,+~ G), Gp ep esen s he con ibu ion o he u hce wa e e ms and LG, is he emaining ha is sui able o complex expo- nen~i;iI expansion. /! " The spa ial doinain e sion o Gp u ns ou o be [4]: whe e No i he numbe o signi ican poles, k, is he loca ion o hep- h pole, 4 i s eqidue and = k:: - k,$ In he bound egime (k: = l > k,,) his exp ession yields exponen ially decaying ields in he anb e se di ec ion. I we a e in e es ed in he leaky egime asocia ed o ii pa icula su ace-wa e pole, i can be p o ed ha i su ices o chenge lie sign o 6,> o ha pa icula pole in (3). 58 1 Au ho ized licensed use limi ed o: Uni e sidad de Se illa. Downloaded on July 09,2020 a 14:11:05 UTC om IEEE Xplo e. Res ic ions apply. - The G, unc ion can be app op ia ely expanded as a siini o coinplcx exponen ial unc ions: ! I,:, G;, c u*c-y~I(o (4) 1=I The space domain con ibu ion o he e ms in he abo e expansion can be analy ically ob ained by using he ollowing iden i y: whe e ( = ,/(:I; - :I:')~ + y2, A'" ib he ze o o de modi ied Bessel unc ion o he sec- ond kind and Hi2) hc ze o o de Haenkel unc ion o he wcond kind. The i s op ion gi e5 place o g owing ields o accoun ing o leaky egime whe eas lic second op- ion p o ides he bound solu ions. In [6, 71 he space-wa leaky modes a c ob ained by imposing an al e na i e in eg a ion pa h in he I;, complex plane o he nume ical e alua ion o :he spec al in eg als (I). This ciilcula ion is supe seded by he p esen app oach. The e m in (I) can be conside ed a pa icula case o (5). To summa ize, he p oposed me hod allow us o analy ically ob ain he spacc doinai ke nel o he in eg al equa ion in bound and lcaky egimes. Once he space domain ke nels ha e been ob ained, he in eg al equa ion is sol ed by using he Gale kin me hod wi h adequa e basis unc ions leading o quasi-analy ical e illua ion o ma ix en ies 141. 3 Nume ical esul s Ou me hod has been alida ed by compa ing ou esul s wi h he ones ob ained by means o a well es ablished SDA code [7] de eloped o ze o- hickiie~h mip-like s iic- u es. The ag eemen in bo h bound and leaky egimes is excellen b - id1 he cascs conside ed. As an example, Figu e 1 shows p opaga ion cons an da a o a space-wa e leaky mode suppo ed by a mic os ip line. Fo he ze o- hickness case, his igu e coin- pa es SDA esul s e sus ou esul s o B/k0 and o/kU. An excellen ag eeinen is obse ed. This s uc u e was also analyzed in [I], showing ou esul s good ag eemen wi h he da a epo ed in [I]. Al hough he ex ension o ou app oach o nonze o hick- ness conduc o s equi es u he ma hema ical s eps han hose p esen ed in his pape , his ask has been done and some nume ical esul s ha e been include in he igu e. 4 Conclusions The MPIE app oach combined wi h he complex iinage me hod has been adap ed o analyzing mic os ip ansmission lines in leaky egime hy he i s ime. Bo h su ace- wa e and space-wa e leaky modes a e inco po a ed o he analysis in a e y simple way. The complex image echnique p o ides high accu acy and e iciency o he analysis. Wo king in he spa ial domain allows o an ex ension o nonplana conduc o s. Al- hough his gene aliza ion is no s aigh o wa d, he heo y epo ed in his pape o e s he necessa y backg ound. 582 Au ho ized licensed use limi ed o: Uni e sidad de Se illa. Downloaded on July 09,2020 a 14:11:05 UTC om IEEE Xplo e. Res ic ions apply. I2l 1 .o 06 A- CO , 4 6 8 io 12 i4 F equency (GHz) Figu e 1 : No malized p opaga ion (P/ko) and a enua ion (culko) cons an s o a space- wa e leaky mode in a mic os ip line: E, = 9.8, w = 3 mm, h = 0.635 mm, = s ip hickness. Re e ences [I] K. A. Michal ky and D. Zheng, "Rigu ous analysis o open mic os ip lines o a bi a y c oss sec ion in hound and leaky egimes," IEEE T ans. Mic owa e Theo y Tech., ol. 37, pp. 2005-2010, Dec. 1989. [2] C-I.G.Hsu, R.F.Ha ing on, K.A.Michalski and D.Zheng "Analysis o mul iconduc o ansmission lines o a bi a y c oss sec ion in mul ilaye ed uniaxial media," IEEE T ans. Mic owa e Theo y Tech., ol. 41, pp. 10-18, Jan. 1993. [3] D.G. Fang, J.J. Yang and G.Y. Delisle, "Disc e e image heo y o ho izon al elec ic dipoles in a mul ilaye ed medium,'' P oc. Ins . Eh. Eng., ol. 135, pp, 297-302, Oc . 1988. [4] J.Bc nal, EMedina, R.R.Boix and M.Ho no, "Fas ull wa e analysis o mul is ip ans- mission lines based on MPIE and complex images,'' IEEE T ans. Mic owa e Theo y Tech., ol. 48, pp.445452, Ma . 2000. [51 E. A. Soliman, P. Pie e s, E. Beyne and G.A.E. Vandenbosch, "Nume ically e icien spa ial-domain momen me hod o mul islo ansmission lines in laye ed media - aplica ion o mul islo in MCM-D echnology," IEEE T ans. Mic owa e Theo y Tech., ol. 47, pp. 1782-1787, Sep. 1999. [61 N.K. Das and D.M. Poza , "Full-wa e spec al-domain compu a ion o ma e ial, adia ion and guided wa e losses in in ini e mul ilaye ed p in ed ansmission lines," IEEE T ans. Mic owa e Theo y Tech., ol. 39, pp. 54-63, Jan. 2000. [71 R. Ma quCs, F. Mesa, "Spec al domain analysis o highe o de leaky modes in mic os ip lines: a new spec al-gap e ec ," Jou nal o Elec omagne ic Wa es and Applica ions, ol. II, pp. 1367-1384.1997. 583 Au ho ized licensed use limi ed o: Uni e sidad de Se illa. Downloaded on July 09,2020 a 14:11:05 UTC om IEEE Xplo e. Res ic ions apply.